Thermal Infrared Detectors: expanding performance limits using ultrafast electron microscopy

Technical Report · Wed Sep 01 00:00:00 EDT 2021

DOI:https://doi.org/10.2172/1821971· OSTI ID:1821971

Talin, Albert ^[1]; Ellis, Scott ^[1]; Bartelt, Norman ^[1]; Leonard, Francois Leonard ^[1]; Perez, Christopher ^[1]; Celio, Km ^[1]; Fuller, Elliot ^[1]; Hughart, David ^[1]; Garland, Diana ^[1]; Marinella, Matthew ^[1]; Michael, Joseph Richard ^[1]; Chandler, David ^[1]; Young, Steve ^[1]; Smith, Sean ^[1]; Kumar, Suhas ^[1]

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1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

This project aimed to identify the performance-limiting mechanisms in mid- to far infrared (IR) sensors by probing photogenerated free carrier dynamics in model detector materials using scanning ultrafast electron microscopy (SUEM). SUEM is a recently developed method based on using ultrafast electron pulses in combination with optical excitations in a pump- probe configuration to examine charge dynamics with high spatial and temporal resolution and without the need for microfabrication. Five material systems were examined using SUEM in this project: polycrystalline lead zirconium titanate (a pyroelectric), polycrystalline vanadium dioxide (a bolometric material), GaAs (near IR), InAs (mid IR), and Si/SiO 2 system as a prototypical system for interface charge dynamics. The report provides detailed results for the Si/SiO 2 and the lead zirconium titanate systems.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: NA0003525
• OSTI ID: 1821971
• Report Number(s): SAND2021-11873; 699978; TRN: US2301672
• Country of Publication: United States
• Language: English

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