Failure Analysis of a New Polyamide-Based Fluoropolymer-Free Backsheet After Combined-Accelerated Stress Testing

Ulicna, Sona; Sinha, Archana; Springer, Martin; Miller, David C.; Hacke, Peter; Schelhas, Laura T.; Owen-Bellini, Michael

doi:10.1109/jphotov.2021.3090152

Failure Analysis of a New Polyamide-Based Fluoropolymer-Free Backsheet After Combined-Accelerated Stress Testing

Journal Article · Tue Jul 20 00:00:00 EDT 2021 · IEEE Journal of Photovoltaics

DOI:https://doi.org/10.1109/jphotov.2021.3090152· OSTI ID:1821905

Ulicna, Sona ^[1]; Sinha, Archana ^[1]; Springer, Martin ^[2]; ^[2]; Hacke, Peter ^[2]; Schelhas, Laura T. ^[2]; Owen-Bellini, Michael ^[2]

SLAC National Accelerator Lab., Menlo Park, CA (United States)
National Renewable Energy Lab. (NREL), Golden, CO (United States)

The viability of novel coextruded, fluoropolymer-free backsheets for photovoltaic (PV) modules has been questioned as a result of a large number of early-life backsheet failures in PV installations containing one of the earliest co-extruded polyamide (PA)-based backsheet to reach the market, “AAA.” New PV reliability testing protocols have been recently developed and applied to backsheets to reproduce failures observed in the field and evaluate the durability of novel backsheet materials and designs prior to commercialization. A new co-extruded PA-based backsheet was tested using combined-accelerated stress testing (C-AST) and demonstrated a greater lifetime than AAA, and some other fluoropolymer-based backsheets such as polyvinylidene fluoride. The improved PA-based backsheet also eventually failed by through-thickness cracking. Using surface and bulk material characterization techniques, we performed a comprehensive study of material properties before and after the stress testing. Aging of the backsheet resulted in an increase of surface roughness by erosion of the outer PA layer. However the failure is more likely related to an increase in crystallinity of the polyolefin core layer reducing the backsheet tearing energy. The analysis can ultimately inform on the specific weaknesses of the materials so that the manufacturer can improve the backsheet design to extend its lifetime.

View Accepted Manuscript (DOE)

Research Organization:: National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE)

Grant/Contract Number:: AC36-08GO28308

OSTI ID:: 1821905

Report Number(s):: NREL/JA--5K00-79182; MainId:33408; UUID:86000d2e-fc68-41d8-8e50-547e591f94bc; MainAdminID:62935

Journal Information:: IEEE Journal of Photovoltaics, Journal Name: IEEE Journal of Photovoltaics Journal Issue: 5 Vol. 11; ISSN 2156-3381

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

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Failure Analysis of a New Polyamide-Based Fluoropolymer-Free Backsheet After Combined-Accelerated Stress Testing

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