Characterization and QC practice of 16-channel ADC ASIC at cryogenic temperature for Liquid Argon TPC front-end readout electronics system in DUNE experiment

Journal Article · Mon Jun 14 00:00:00 EDT 2021 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/16/06/t06005· OSTI ID:1821205

Lopriore, E. ^[1]; Braga, D. ^[2]; Chen, H. ^[1]; Christian, D. ^[2]; Dabrowski, M. ^[1]; Deptuch, G. ^[1]; Fried, J. ^[1]; Furic, I. ^[3]; Gao, S. ^[1]; Grace, C. R. ^[4]; Hoff, J. ^[2]; Holm, S. ^[2]; Lin, C. -J. ^[4]; Miryala, S. ^[1]; Prakash, T. ^[4]; Tang, S. ^[1]; Vernon, E. ^[1]; Zhang, J. ^[1]

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1. Brookhaven National Lab. (BNL), Upton, NY (United States)
2. Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
3. Univ. of Florida, Gainesville, FL (United States)
4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

ColdADC is a low-noise 16-channel analog-to-digital converter ASIC designed for cold readout electronics of Liquid Argon Time Projection Chambers (LArTPCs) in the Deep Underground Neutrino Experiment (DUNE). ColdADC was specifically designed for operation at cryogenic temperatures (77 K–89 K). Cold electronics is considered to be an enabling technology for liquid argon detectors in neutrino experiments. The main function of the chip is to digitize signals from the 16-channel charge-sensitive amplifier designed at BNL (LArASIC) and send digitized signals to the data aggregator and serializer chip (COLDATA). ColdADC operates with a resolution of 12 bits and a sampling rate of 2 MS/s per channel. A complete characterization of prototype chips was conducted at cryogenic temperature, involving power consumption, noise and linearity performance. In the first DUNE Far-Detector module, 384000 data channels will be read out, corresponding to 24000 ColdADC chips. Therefore, systematic testing of ColdADC chips at cryogenic temperature is vital for the quality and reliability of DUNE Single-Phase modules. We have developed a Quality Control (QC) test stand that includes ColdADC evaluation and characterization at cryogenic temperature. The QC procedure was applied to a first batch of 33 chips, corresponding to 528 data channels. The obtained results meet all the required DUNE specifications for ColdADC. Moreover, the testing outcome allowed us to identify possibilities of performance optimization that are currently being addressed in the design of the next version of the chip. The Quality Control procedure is proved to be successful and will be a reference design for future large-batch production testing of final ColdADC ASICs.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States); Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP)
• Grant/Contract Number: SC0012704; AC02-07CH11359
• OSTI ID: 1821205
• Alternate ID(s): OSTI ID: 1832787
• Report Number(s): BNL-222138-2021-JAAM; FERMILAB-PUB-21-281-ND-PPD; TRN: US2214322
• Journal Information: Journal of Instrumentation, Vol. 16, Issue 06; ISSN 1748-0221
• Publisher: Institute of Physics (IOP)
• Country of Publication: United States
• Language: English

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY