Highly Efficient Plasmon Induced Hot-Electron Transfer at Ag/TiO2 Interface

Song, Jia; Long, Jinlin; Liu, Yawei; Xu, Zihao; Ge, Aimin; Piercy, Brandon D.; Cullen, David A.; Ivanov, Ilia N.; McBride, James R.; Losego, Mark D.; Lian, Tianquan

doi:10.1021/acsphotonics.1c00321

Highly Efficient Plasmon Induced Hot-Electron Transfer at Ag/TiO₂ Interface

Journal Article · Thu Apr 29 00:00:00 EDT 2021 · ACS Photonics

DOI:https://doi.org/10.1021/acsphotonics.1c00321· OSTI ID:1818646

Song, Jia ^[1]; ^[2]; Liu, Yawei ^[1]; ^[1]; Ge, Aimin ^[1]; Piercy, Brandon D. ^[3]; ^[4]; ^[4]; ^[5]; ^[3]; ^[1]

Emory Univ., Atlanta, GA (United States)
Emory Univ., Atlanta, GA (United States); Fuzhou Univ. (China)
Georgia Inst. of Technology, Atlanta, GA (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Vanderbilt Univ., Nashville, TN (United States). Vanderbilt Institute of Nanoscale Science and Engineering

Plasmon induced hot carrier transfer is a promising novel approach for solar energy conversion, but its practical application is often hindered by its low efficiency. This work demonstrates an unprecedented quantum efficiency of plasmonic hot-electron transfer of up to 53 ± 2% from 1.7 nm silver nanoparticles to anatase nanoporous TiOsub>2 films at 400 nm excitation. This efficient hot-electron transfer consists of contributions of both hot electrons generated by plasmon decay through exciting Ag intraband transitions and Ag-to-TiO₂ interfacial charge-transfer transitions. The efficiencies of both pathways increase at smaller Ag particle sizes from 5.9 to 1.7 nm, suggesting that decreasing particle sizes is a promising way toward efficient plasmonic hot-carrier extraction.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: China Scholarship Council; USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725; SC0008798

OSTI ID:: 1818646

Journal Information:: ACS Photonics, Journal Name: ACS Photonics Journal Issue: 5 Vol. 8; ISSN 2330-4022

Publisher:: American Chemical Society (ACS)Copyright Statement

Country of Publication:: United States

Language:: English

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37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
TiO₂
chemical interface damping
hot-electron transfer
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surface plasmon resonance

Highly Efficient Plasmon Induced Hot-Electron Transfer at Ag/TiO2 Interface

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