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Title: High resolution >40 keV x-ray radiography using an edge-on micro-flag backlighter at NIF-ARC

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/5.0043783· OSTI ID:1811762

Radiography of low-contrast features in high-density materials evolving on a nanosecond timescale requires a bright photon source in the tens of keV range with high temporal and spatial resolution. One application for sources in this category is the study of dynamic material strength in samples compressed to Mbar pressures at the National Ignition Facility, high-resolution measurements of plastic deformation under conditions relevant to meteor impacts, geophysics, armor development, and inertial confinement fusion. We present radiographic data and the modulation transfer function (MTF) analysis of a multi-component test object probed at ∼100 keV effective backlighter energy using a 5 μm-thin dysprosium foil driven by the NIF Advanced Radiographic Capability (ARC) short-pulse laser (∼2 kJ, 10 ps). The thin edge of the foil acts as a bright line-projection source of hard x rays, which images the test object at 13.2× magnification into a filtered and shielded image plate detector stack. The system demonstrates a superior contrast of shallow (5 μm amplitude) sinusoidal ripples on gold samples up to 90 μm thick as well as enhanced spatial and temporal resolution using only a small fraction of the laser energy compared to an existing long-pulse-driven backlighter used routinely at the NIF for dynamic strength experiments.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1811762
Alternate ID(s):
OSTI ID: 1771342
Report Number(s):
LLNL-JRNL-820930; 1032397; TRN: US2213856
Journal Information:
Review of Scientific Instruments, Vol. 92, Issue 3; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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