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Cryogenic single-port calibration for superconducting microwave resonator measurements

Journal Article · · Quantum Science and Technology
 [1];  [2];  [3];  [4];  [3];  [5];  [6];  [6];  [7];  [8];  [9]
  1. Univ. of Colorado, Boulder, CO (United States); National Inst. of Standards and Technology (NIST), Boulder, CO (United States); Univ. of Colorado, Boulder, CO (United States). JILA; Lab. for Physical Sciences, College Park, MD (United States)
  2. Keysight Technologies, Santa Rosa, CA (United States)
  3. Univ. of Colorado, Boulder, CO (United States); National Inst. of Standards and Technology (NIST), Boulder, CO (United States); Univ. of Colorado, Boulder, CO (United States). JILA
  4. Google Quantum AI, Mountain View, CA (United States); Univ. of Massachusetts, Amherst, MA (United States)
  5. Keysight Technologies, Santa Rosa, CA (United States); Univ. of Waterloo, ON (Canada). Inst. for Quantum Computing and Electrical and Computer Engineering
  6. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  7. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Keysight Technologies Inc., Cambridge, MA (United States). Quantum R&D Center
  8. Univ. of Colorado, Boulder, CO (United States); National Inst. of Standards and Technology (NIST), Boulder, CO (United States)
  9. Univ. of Colorado, Boulder, CO (United States); Google Quantum AI, Mountain View, CA (United States); Rigetti Computing, Berkeley, CA (United States)

Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. Additionally, a common method, imposed by limitations on the device design or experimental configuration, is the single-port reflection geometry, i.e. reflection-mode. However, impedance mismatches in cryogenic systems must be accounted for through calibration of the measurement chain while it is at low temperatures. In this paper, we demonstrate a data-based, single-port calibration using commercial microwave standards and a vector network analyzer with samples at millikelvin temperature in a dilution refrigerator, making this method useful for measurements of quantum phenomena. Finally, we cross reference our data-based, single-port calibration and reflection measurement with over-coupled 2D- and 3D-resonators against well established two-port techniques corroborating the validity of our method.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA); National Science Foundation (NSF)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1810671
Report Number(s):
LLNL-JRNL--818167; 1027923
Journal Information:
Quantum Science and Technology, Journal Name: Quantum Science and Technology Journal Issue: 3 Vol. 6; ISSN 2058-9565
Publisher:
IOPscienceCopyright Statement
Country of Publication:
United States
Language:
English

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