High laser fluence ITO coatings utilizing a Fabry-Perot thin film filter to reduce effective absorption

Stolz, Christopher J.; Sytchkova, Anna; Doerner, Paul; Kupinski, Pete; Feigenbaum, Eyal; Teslich, Nick; Menor, Marlon; Adams, John

doi:10.1364/OE.426570

High laser fluence ITO coatings utilizing a Fabry-Perot thin film filter to reduce effective absorption

Journal Article · Wed Jul 14 00:00:00 EDT 2021 · Optics Express

DOI:https://doi.org/10.1364/OE.426570· OSTI ID:1808197

; Sytchkova, Anna; Doerner, Paul; Kupinski, Pete; ; Teslich, Nick; Menor, Marlon; Adams, John

Laser-induced damage threshold of transparent conductors, such as Indium Tin Oxide (ITO), is limited by their high optical absorption due to free carriers. However, the effective absorption of a transparent conductor thin film can be reduced by an order of magnitude, without changing the electrical characteristics of the film, when placed in a low electric field section of a multilayer coating. A Fabry-Perot thin film interference filter has both high transmittance and low electric field positions, so it is an ideal thin film structure for this application. Although Fabry-Perot interference filters are not known as particularly high laser-induced damage resistant coatings due to their resonant characteristics, a laser-induced damage threshold (LIDT) improvement of up to 8× was observed with this technique compared to single layer ITO coatings fabricated using either radio frequency magnetron sputtering or electron-beam deposition. Additionally, an approximately 4× LIDT improvement for a Fabry-Perot interference filter has been observed by the addition of ITO into the multilayer structure.

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Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: W-7405-ENG-48

OSTI ID:: 1808197

Alternate ID(s):: OSTI ID: 1823687

Journal Information:: Optics Express, Journal Name: Optics Express Journal Issue: 15 Vol. 29; ISSN 1094-4087; ISSN OPEXFF

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

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