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System-on-chip upgrade of millimeter-wave imaging diagnostics for fusion plasma

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/5.0040449· OSTI ID:1804652

Monolithic, millimeter wave “system-on-chip” technology has been employed in chip heterodyne radiometers in a newly developed Electron Cyclotron Emission Imaging (ECEI) system on the DIII-D tokamak for 2D electron temperature and fluctuation diagnostics. The system employs 20 horn-waveguide receiver modules each with customized W-band (75–110 GHz) monolithic microwave integrated circuit chips comprising a W-band low noise amplifier, a balanced mixer, a ×2 local oscillator (LO) frequency doubler, and two intermediate frequency amplifier stages in each module. Compared to previous quasi-optical ECEI arrays with Schottky mixer diodes mounted on planar antennas, the upgraded W-band array exhibits >30 dB additional gain and 20× improvement in noise temperature; an internal eight times multiplier chain is used to provide LO coupling, thereby eliminating the need for quasi-optical coupling. The horn-waveguide shielding housing avoids out-of-band noise interference on each module. The upgraded ECEI system plays an important role for absolute electron temperature and fluctuation measurements for edge and core region transport physics studies. An F-band receiver chip (up to 140 GHz) is under development for additional fusion facilities with a higher toroidal magnetic field. Visualization diagnostics provide multi-scale and multi-dimensional data in plasma profile evolution. Finally, a significant aspect of imaging measurement is focusing on artificial intelligence for science applications.

Research Organization:
Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States); Univ. of California, Davis, CA (United States)
Sponsoring Organization:
USDOE
Contributing Organization:
DIII-D facility
Grant/Contract Number:
FG02-99ER54531; FC02-04ER54698; AC02-09CH11466
OSTI ID:
1804652
Alternate ID(s):
OSTI ID: 1810631
OSTI ID: 1782371
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 5 Vol. 92; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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