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Gap States in Methylammonium Lead Halides: The Link to Dimethylsulfoxide?

Journal Article · · Advanced Materials
 [1];  [2];  [3];  [1]
  1. Department of Electrical Engineering Princeton University Princeton NJ 08544 USA
  2. Department of Chemical and Biological Engineering Princeton University Princeton NJ 08544 USA
  3. Department of Chemical and Biological Engineering Princeton University Princeton NJ 08544 USA, Andlinger Center for Energy and the Environment Princeton University Princeton NJ 08544 USA
Abstract

Understanding the origin and distribution of electronic gap states in metal halide perovskite (MHP) thin films is crucial to the further improvement of the efficiency and long‐term stability of MHP‐based optoelectronic devices. In this work, the impact of Lewis‐basic additives introduced in the precursor solution on the density of states in the perovskite bandgap is investigated. Ultraviolet photoemission spectroscopy and contact potential difference measurements are conducted on MHP thin films processed from dimethylformamide (DMF)‐based solutions to which either no additive, dimethylsulfoxide (DMSO), or N ‐methylpyrrolidine‐2‐thione (NMPT) is added. The results show the presence of a density of states in the gap of methylammonium lead halide films processed from DMSO‐containing solution. The density of gap states is either suppressed when the methylammonium concentration in mixed cation films is reduced or when NMPT is used as an additive, and eliminated when methylammonium (MA) is replaced with cesium or formamidinium (FA). These results are consistent with the notion that reaction products that result from DMSO reacting with MA + in the precursor solution are responsible for the formation of gap states.

Sponsoring Organization:
USDOE
Grant/Contract Number:
EE0008560
OSTI ID:
1804149
Alternate ID(s):
OSTI ID: 1848839
Journal Information:
Advanced Materials, Journal Name: Advanced Materials Journal Issue: 42 Vol. 32; ISSN 0935-9648
Publisher:
Wiley Blackwell (John Wiley & Sons)Copyright Statement
Country of Publication:
Germany
Language:
English

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