Two-channel anomalous Hall effect in SrRuO3

Kimbell, Graham; Sass, Paul M.; Woltjes, Bart; Ko, Eun Kyo; Noh, Tae Won; Wu, Weida; Robinson, Jason W. A.

doi:10.1103/physrevmaterials.4.054414

Two-channel anomalous Hall effect in SrRuO₃

Journal Article · Mon May 18 00:00:00 EDT 2020 · Physical Review Materials

DOI:https://doi.org/10.1103/physrevmaterials.4.054414· OSTI ID:1803269

^[1]; ^[2]; ^[3]; Ko, Eun Kyo ^[4]; ^[4]; ^[2]; ^[3]

Univ. of Cambridge (United Kingdom); OSTI
Rutgers Univ., Piscataway, NJ (United States)
Univ. of Cambridge (United Kingdom)
Institute for Basic Science (IBS), Seoul (Korea); Seoul National Univ. (Korea)

The Hall effect in SrRuO₃ thin films near the thickness limit for ferromagnetism shows an extra peak in addition to the ordinary and anomalous Hall effects. This extra peak has been attributed to a topological Hall effect due to two-dimensional skyrmions in the film around the coercive field; however, the sign of the anomalous Hall effect in SrRuO₃ can change as a function of saturation magnetization. Here we report Hall peaks in SrRuO₃ in which volumetric magnetometry measurements and magnetic force microscopy indicate that the peaks result from the superposition of two anomalous Hall channels with opposite sign. These channels likely form due to thickness variations in SrRuO₃, creating two spatially separated magnetic regions with different saturation magnetizations and coercive fields. Overall, the results are central to the development of strongly correlated materials for spintronics.

View Accepted Manuscript (DOE)

Research Organization:: Rutgers Univ., Piscataway, NJ (United States)

Sponsoring Organization:: Engineering and Physical Sciences Research Council (EPSRC); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division

Grant/Contract Number:: SC0018153

OSTI ID:: 1803269

Journal Information:: Physical Review Materials, Journal Name: Physical Review Materials Journal Issue: 5 Vol. 4; ISSN 2475-9953

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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