Applications of principal component analysis for energy reconstruction in position-sensitive semiconductor detectors

Williams, B.; Zhu, Y. F.; He, Z.

doi:10.1016/j.nima.2019.04.002

Applications of principal component analysis for energy reconstruction in position-sensitive semiconductor detectors

Journal Article · Mon Apr 08 00:00:00 EDT 2019 · Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment

DOI:https://doi.org/10.1016/j.nima.2019.04.002· OSTI ID:1801112

Williams, B. ^[1]; Zhu, Y. F. ^[2]; He, Z. ^[2]

University of Michigan, Ann Arbor, MI (United States); OSTI
University of Michigan, Ann Arbor, MI (United States)

We report semiconductor detectors with pixelated anodes offer a desirable combination of position sensitivity and energy resolution that are suitable for numerous applications in gamma-ray detection and imaging. Pixelization of electrodes also entails a non-uniform amplitude response as a function of gamma-ray interaction position. Energy calibrations as a function of interaction position improve energy resolution, but systematic errors in the energy reconstruction process persist and limit energy resolution at fixed electronic noise. Digitization of signals induced on collecting and adjacent electrodes offers rich information about gamma-ray interactions and their charge drift and collection as a function of time. Despite the abundance of signals for each interaction, human intuition and rule-based approaches fail to utilize the entire set of observed signals to mitigate the sources of systematic error. In order to maximize the utility of digitized signals and improve energy resolution, principal component analysis is applied towards digitized signals observed in semiconductor detectors with pixelated anodes. Principal components identified in the process form the basis for position-specific energy corrections. By leveraging this additional information encoded within digitized signals, energy resolution improves by factors between 10 and 15% with respect to full-width at half and tenth maximum values. The feature that accounts for the maximum amount of explained variance between interactions in any given pixel correlates strongly with the depth of interaction.

View Accepted Manuscript (DOE)

Research Organization:: University of Michigan, Ann Arbor, MI (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: NA0002534

OSTI ID:: 1801112

Alternate ID(s):: OSTI ID: 1595523

Journal Information:: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment, Journal Name: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment Journal Issue: C Vol. 954; ISSN 0168-9002

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
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Applications of principal component analysis for energy reconstruction in position-sensitive semiconductor detectors

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