First measurement of S/XB values of Re I visible emission lines

Nishijima, D.; Doerner, R. P.

doi:10.1088/1361-6455/ab4702

First measurement of S/XB values of Re I visible emission lines

Journal Article · Fri Oct 25 00:00:00 EDT 2019 · Journal of Physics. B, Atomic, Molecular and Optical Physics

DOI:https://doi.org/10.1088/1361-6455/ab4702· OSTI ID:1800535

^[1]; Doerner, R. P. ^[2]

Univ. of California, San Diego, La Jolla, CA (United States); OSTI
Univ. of California, San Diego, La Jolla, CA (United States)

A spectroscopic parameter, so called S/XB (the number of ionization events per photon or inverse photon efficiency), is experimentally determined for Re I visible emission lines (488.9, 527.1, and 527.6 nm) at an electron temperature range of ~2–8 eV in the PISCES-B linear plasma device. Our standard mass loss method was applied, where a pure Re sample was sputtered by Ar plasma. In addition, a new alloy method was developed, where a W-3.3 at% Re alloy sample was used. In the new method, the sputtered flux ratio of Re and W atoms is assumed to be the same as the elemental composition because of the very similar sputtering yields. In this work, good agreement in measured Re I S/XB values is obtained between the standard mass loss and new alloy methods.

View Accepted Manuscript (DOE)

Research Organization:: Univ. of California, San Diego, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Fusion Energy Sciences (FES)

Grant/Contract Number:: FG02-07ER54912

OSTI ID:: 1800535

Alternate ID(s):: OSTI ID: 22985603

Journal Information:: Journal of Physics. B, Atomic, Molecular and Optical Physics, Journal Name: Journal of Physics. B, Atomic, Molecular and Optical Physics Journal Issue: 22 Vol. 52; ISSN 0953-4075

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United States

Language:: English

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71 CLASSICAL AND QUANTUM MECHANICS
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First measurement of S/XB values of Re I visible emission lines

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