Real-space charge-density imaging with sub-ångström resolution by four-dimensional electron microscopy

Gao, Wenpei; Addiego, Christopher; Wang, Hui; Yan, Xingxu; Hou, Yusheng; Ji, Dianxiang; Heikes, Colin; Zhang, Yi; Li, Linze; Huyan, Huaixun; Blum, Thomas; Aoki, Toshihiro; Nie, Yuefeng; Schlom, Darrell G.; Wu, Ruqian; Pan, Xiaoqing

doi:10.1038/s41586-019-1649-6

Title: Real-space charge-density imaging with sub-ångström resolution by four-dimensional electron microscopy

Journal Article · Mon Oct 14 00:00:00 EDT 2019 · Nature (London)

DOI:https://doi.org/10.1038/s41586-019-1649-6· OSTI ID:1800334

Gao, Wenpei; Addiego, Christopher; Wang, Hui; Yan, Xingxu; Hou, Yusheng; Ji, Dianxiang; Heikes, Colin; Zhang, Yi; Li, Linze; Huyan, Huaixun; Blum, Thomas; Aoki, Toshihiro; Nie, Yuefeng; Schlom, Darrell G.; Wu, Ruqian; Pan, Xiaoqing

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Research Organization:: Univ. of California, Irvine, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: FG02-05ER46237; SC0014430

OSTI ID:: 1800334

Journal Information:: Nature (London), Vol. 575, Issue 7783; ISSN 0028-0836

Publisher:: Nature Publishing Group

Country of Publication:: United States

Language:: English

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