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Influence of Heterointerfaces on the Kinetics of Oxygen Surface Exchange on Epitaxial La1.85Sr0.15CuO4 Thin Films

Journal Article · · Applied Sciences
DOI:https://doi.org/10.3390/app11093778· OSTI ID:1797906
 [1];  [2];  [2];  [3];  [1]
  1. Univ. of South Carolina, Columbia, SC (United States)
  2. Ulsan National Institute of Science and Technology, Ulsan (Korea, Republic of)
  3. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Considerable attention has been directed to understanding the influence of heterointerfaces between Ruddlesden–Popper (RP) phases and ABO3 perovskites on the kinetics of oxygen electrocatalysis at elevated temperatures. Here, we report the effect of heterointerfaces on the oxygen surface exchange kinetics by employing heteroepitaxial oxide thin films formed by decorating LaNiO3 (LNO) on La1.85Sr0.15CuO4 (LSCO) thin films. Regardless of LNO decoration, tensile in-plane strain on LSCO films does not change. The oxygen surface exchange coefficients (kchem) of LSCO films extracted from electrical conductivity relaxation curves significantly increase with partial decorations of LNO, whereas full LNO coverage leads to the reduction in the kchem of LSCO films. The activation energy for oxygen exchange in LSCO films significantly decreases with partial LNO decorations in contrast with the full coverage of LNO. Optical spectroscopy reveals the increased oxygen vacancies in the partially covered LSCO films relative to the undecorated LSCO film. We attribute the enhanced oxygen surface exchange kinetics of LSCO to the increased oxygen vacancies by creating the heterointerface between LSCO and LNO.
Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
Grant/Contract Number:
AC05-00OR22725; SC0021363
OSTI ID:
1797906
Alternate ID(s):
OSTI ID: 1991685
Journal Information:
Applied Sciences, Journal Name: Applied Sciences Journal Issue: 9 Vol. 11; ISSN 2076-3417
Publisher:
MDPICopyright Statement
Country of Publication:
United States
Language:
English

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