Chapter 10: Nanometer-Scale Characterization of Thin-Film Solar Cells by Atomic Force Microscopy-Based Electrical Probes
KPFM and SSRM, which relate to the following characterization reviews, will be introduced briefly in Section 10.2. Some recent nm-scale characterizations of perovskite, CIGS, and CdTe thin-film solar cell materials and devices will be reviewed in Sections 10.3-10.5 and closing remarks will be given in Section 10.6.
- Research Organization:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1783564
- Report Number(s):
- NREL/CH-5K00-80001; MainId:41206; UUID:1096c991-a414-407f-8ef0-d1b804da234a; MainAdminID:23468
- Country of Publication:
- United States
- Language:
- English
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