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Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

Journal Article · · Journal of Instrumentation
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Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. Here, in this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm. We also see that the reflectance of PTFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States); Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States); Pacific Northwest National Laboratory (PNNL), Richland, WA (United States); Univ. of Texas, Arlington, TX (United States)
Sponsoring Organization:
USDOE; USDOE Office of Science (SC), Nuclear Physics (NP)
Contributing Organization:
NEXT Collaboration
Grant/Contract Number:
AC02-06CH11357; AC02-07CH11359; AC05-76RL01830; SC0010813; SC0019054; SC0019223
OSTI ID:
1777153
Alternate ID(s):
OSTI ID: 23037164
OSTI ID: 1907098
OSTI ID: 1908634
Report Number(s):
PNNL-SA-172576; 163630
Journal Information:
Journal of Instrumentation, Journal Name: Journal of Instrumentation Journal Issue: 11 Vol. 15; ISSN 1748-0221
Publisher:
Institute of Physics (IOP)Copyright Statement
Country of Publication:
United States
Language:
English

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Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air
Journal Article · Mon Jul 13 00:00:00 EDT 2020 · TBD · OSTI ID:1647060

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