Polaritons, which are quasiparticles composed of a photon coupled to an electric or magnetic dipole, are a major focus in nanophotonic research of van der Waals (vdW) crystals and their derived 2D materials. For the variety of existing vdW materials, polaritons can be active in a broad range of the electromagnetic spectrum (meVs to eVs) and exhibit momenta much higher than the corresponding free-space radiation. Hence, the use of high momentum broadband sources or probes is imperative to excite those quasiparticles and measure the frequency-momentum dispersion relations, which provide insights into polariton dynamics. Synchrotron infrared nanospectroscopy (SINS) is a technique that combines the nanoscale spatial resolution of scattering-type scanning near-field optical microscopy with ultrabroadband synchrotron infrared radiation, making it highly suitable to probe and characterize a variety of vdW polaritons. In this work, the advances enabled by SINS on the study of key photonic attributes of far- and mid-infrared plasmon- and phonon-polaritons in vdW and 2D crystals are reviewed. In that context the SINS technique is comprehensively described and it is demonstrated how fundamental polaritonic properties are retrieved for a range of atomically thin systems including hBN, MoS2, graphene and 2D heterostructures. 2
Barcelos, Ingrid D., et al. "Probing Polaritons in 2D Materials with Synchrotron Infrared Nanospectroscopy." Advanced Optical Materials, vol. 8, no. 5, Dec. 2019. https://doi.org/10.1002/adom.201901091
Barcelos, Ingrid D., Bechtel, Hans A., de Matos, Christiano S., Bahamon, Dario A., Kaestner, Bernd, Maia, Francisco B., & Freitas, Raul O. (2019). Probing Polaritons in 2D Materials with Synchrotron Infrared Nanospectroscopy. Advanced Optical Materials, 8(5). https://doi.org/10.1002/adom.201901091
Barcelos, Ingrid D., Bechtel, Hans A., de Matos, Christiano S., et al., "Probing Polaritons in 2D Materials with Synchrotron Infrared Nanospectroscopy," Advanced Optical Materials 8, no. 5 (2019), https://doi.org/10.1002/adom.201901091
@article{osti_1775370,
author = {Barcelos, Ingrid D. and Bechtel, Hans A. and de Matos, Christiano S. and Bahamon, Dario A. and Kaestner, Bernd and Maia, Francisco B. and Freitas, Raul O.},
title = {Probing Polaritons in 2D Materials with Synchrotron Infrared Nanospectroscopy},
annote = {Polaritons, which are quasiparticles composed of a photon coupled to an electric or magnetic dipole, are a major focus in nanophotonic research of van der Waals (vdW) crystals and their derived 2D materials. For the variety of existing vdW materials, polaritons can be active in a broad range of the electromagnetic spectrum (meVs to eVs) and exhibit momenta much higher than the corresponding free-space radiation. Hence, the use of high momentum broadband sources or probes is imperative to excite those quasiparticles and measure the frequency-momentum dispersion relations, which provide insights into polariton dynamics. Synchrotron infrared nanospectroscopy (SINS) is a technique that combines the nanoscale spatial resolution of scattering-type scanning near-field optical microscopy with ultrabroadband synchrotron infrared radiation, making it highly suitable to probe and characterize a variety of vdW polaritons. In this work, the advances enabled by SINS on the study of key photonic attributes of far- and mid-infrared plasmon- and phonon-polaritons in vdW and 2D crystals are reviewed. In that context the SINS technique is comprehensively described and it is demonstrated how fundamental polaritonic properties are retrieved for a range of atomically thin systems including hBN, MoS2, graphene and 2D heterostructures. 2},
doi = {10.1002/adom.201901091},
url = {https://www.osti.gov/biblio/1775370},
journal = {Advanced Optical Materials},
issn = {ISSN 2195-1071},
number = {5},
volume = {8},
place = {United States},
publisher = {Wiley},
year = {2019},
month = {12}}
Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences, Vol. 362, Issue 1817https://doi.org/10.1098/rsta.2003.1347