Passive millimeter wave radiometer system for calibration of infrared cameras
Patent
·
OSTI ID:1771768
An apparatus for accurate measurement of surface and sub-surface temperatures of an object from a distance without contacting the object is provided. Illustrative embodiments provide for simultaneous measurement of thermal emission and emissivity in the mm-wave regime thereby enabling real-time non-contact measurement of emissivity. Corrected temperatures for the object which may be used for calibration of infrared thermographic cameras are determined from the measurement of emissivity.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- NA0003525
- Assignee:
- National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM); MASSACHUSETTS INSTITUTE OF TECHNOLOGY (Cambridge, MA)
- Patent Number(s):
- 10,876,898
- Application Number:
- 16/058,855
- OSTI ID:
- 1771768
- Resource Relation:
- Patent File Date: 08/08/2018
- Country of Publication:
- United States
- Language:
- English
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