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Title: Passive millimeter wave radiometer system for calibration of infrared cameras

Patent ·
OSTI ID:1771768

An apparatus for accurate measurement of surface and sub-surface temperatures of an object from a distance without contacting the object is provided. Illustrative embodiments provide for simultaneous measurement of thermal emission and emissivity in the mm-wave regime thereby enabling real-time non-contact measurement of emissivity. Corrected temperatures for the object which may be used for calibration of infrared thermographic cameras are determined from the measurement of emissivity.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM); MASSACHUSETTS INSTITUTE OF TECHNOLOGY (Cambridge, MA)
Patent Number(s):
10,876,898
Application Number:
16/058,855
OSTI ID:
1771768
Resource Relation:
Patent File Date: 08/08/2018
Country of Publication:
United States
Language:
English

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