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Title: Method and apparatus for evaluating superconducting tunnel junction detector noise versus bias voltage

Abstract

A technique for characterizing the noise behavior of a superconducting tunnel junction (STJ) detector as a function of its applied bias voltage Vb by stepping the STJ's bias voltage across a predetermined range and, at each applied bias, making multiple measurements of the detector's current, calculating their mean and their standard deviation from their mean, and using this standard deviation as a measure of the STJ detector's noise at that applied bias. Because the method is readily executed under computer control, it is particularly useful when large numbers of STJ detectors require biasing, as in STJ detector arrays In a preferred implementation, the STJ is measured under computer control by attaching it to a digital spectrometer comprising a digital x-ray processor (DXP) coupled to a preamplifier that can set the STJ's bias voltage Vb using a digital-to-analog converter (DAC) controlled by the DXP.

Inventors:
;
Publication Date:
Research Org.:
XIA, LLC, Hayward, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1771559
Patent Number(s):
10,816,587
Application Number:
15/141,681
Assignee:
XIA LLC (Hayward, CA)
DOE Contract Number:  
SC0002256
Resource Type:
Patent
Resource Relation:
Patent File Date: 04/28/2016
Country of Publication:
United States
Language:
English

Citation Formats

Warburton, William K., and Harris, Jackson T. Method and apparatus for evaluating superconducting tunnel junction detector noise versus bias voltage. United States: N. p., 2020. Web.
Warburton, William K., & Harris, Jackson T. Method and apparatus for evaluating superconducting tunnel junction detector noise versus bias voltage. United States.
Warburton, William K., and Harris, Jackson T. 2020. "Method and apparatus for evaluating superconducting tunnel junction detector noise versus bias voltage". United States. https://www.osti.gov/servlets/purl/1771559.
@article{osti_1771559,
title = {Method and apparatus for evaluating superconducting tunnel junction detector noise versus bias voltage},
author = {Warburton, William K. and Harris, Jackson T.},
abstractNote = {A technique for characterizing the noise behavior of a superconducting tunnel junction (STJ) detector as a function of its applied bias voltage Vb by stepping the STJ's bias voltage across a predetermined range and, at each applied bias, making multiple measurements of the detector's current, calculating their mean and their standard deviation from their mean, and using this standard deviation as a measure of the STJ detector's noise at that applied bias. Because the method is readily executed under computer control, it is particularly useful when large numbers of STJ detectors require biasing, as in STJ detector arrays In a preferred implementation, the STJ is measured under computer control by attaching it to a digital spectrometer comprising a digital x-ray processor (DXP) coupled to a preamplifier that can set the STJ's bias voltage Vb using a digital-to-analog converter (DAC) controlled by the DXP.},
doi = {},
url = {https://www.osti.gov/biblio/1771559}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {10}
}

Works referenced in this record:

Low-power biasing networks for superconducting integrated circuits
patent, October 2013


Superconducting tunnel junction device
patent, April 2002


Devices incorporating phonon filters
patent, September 1982


Cryogenic, high-resolution x-ray detector with high count rate capability
patent, March 2003


Particle detector assembly
patent, March 2006


Method of processing an image in which the noise is signal-dependent
patent, July 2001