X-ray characterization of anisotropic defect formation in SiC under irradiation with applied stress

Koyanagi, Takaaki; Sprouster, David J.; Snead, Lance; Kato, Yutai

doi:10.1016/j.scriptamat.2021.113785

X-ray characterization of anisotropic defect formation in SiC under irradiation with applied stress

Journal Article · Sat Feb 06 00:00:00 EST 2021 · Scripta Materialia

DOI:https://doi.org/10.1016/j.scriptamat.2021.113785· OSTI ID:1766393

^[1]; Sprouster, David J. ^[2]; Snead, Lance ^[2]; ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
State Univ. of New York (SUNY), Stony Brook, NY (United States)

In this study, high-energy x-ray diffraction is employed to gain insight into the irradiation-induced creep behavior of silicon carbide (SiC). Polycrystalline β-SiC specimens were simultaneously exposed to elevated temperature neutron-irradiation and mechanically applied stresses. The structural disordering was subsequently examined using two-dimensional x-ray diffraction. The intensity of the (111) shoulder peak, an indication of stacking disorder, increased when the specimens were irradiated under tensile stress. This is the first observation of nanoscale stress-induced stacking disorder in SiC at low neutron fluences. These findings suggest stress-induced preferential nucleation and/or growth of defect clusters as a key creep mechanism in neutron irradiated SiC.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Nuclear Energy (NE); USDOE Office of Science (SC), Fusion Energy Sciences (FES)

Grant/Contract Number:: AC05-00OR22725; SC0012704; SC0018322

OSTI ID:: 1766393

Alternate ID(s):: OSTI ID: 1780087
OSTI ID: 1783465
OSTI ID: 23196481

Journal Information:: Scripta Materialia, Journal Name: Scripta Materialia Vol. 197; ISSN 1359-6462

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
irradiation creep
neutron irradiation
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X-ray characterization of anisotropic defect formation in SiC under irradiation with applied stress

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