Characterization of refractory materials using sapphire strain gages
Conference
·
OSTI ID:175584
- Fiber & Sensor Technologies, Inc., Blacksburg, VA (United States); and others
A high-temperature sapphire strain gage based on the optical fiber extrinsic Fizeau interferometric sensor (EFI) was used to measure strain on a compressive loaded silicon carbide rod at a temperature of 1100{degrees}C. Experimental strain sensitivities on the order of 1 {mu}{epsilon} were obtained.
- OSTI ID:
- 175584
- Report Number(s):
- CONF-9501103--
- Country of Publication:
- United States
- Language:
- English
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