Talbot-Lau X-Ray Deflectometry for Dynamic Density Profile Measurements
Conference
·
· Review of Scientific Instruments
OSTI ID:1735970
- National Security Technologies, LLC. (NSTec), Las Vegas, NV (United States)
X-ray phase contrast imaging with transmission gratings for density profile measurements is being developed for dynamic experimental applications. Talbot-Lau deflectometry is a new method of measuring x-ray refraction in addition to attenuation and ultra-small angle scattering that has recently been developed for static imaging, primarily for medical and industrial applications. A flash x-ray source, with a spot size much larger than the continuous microfocus sources of static imaging systems, must be used to obtain density profiles from fast-evolving systems, and only a single exposure can be obtained. These new challenges are addressed by introducing an asymmetric setup and developing a forward modeling technique to infer an electron density profile from a single-image, low spatial–resolution system.
- Research Organization:
- Nevada National Security Site/Mission Support and Test Services LLC; Las Vegas, NV (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP)
- DOE Contract Number:
- AC52-06NA25946
- OSTI ID:
- 1735970
- Report Number(s):
- DOE/NV/25946--2865; STIP WF - 4531844
- Conference Information:
- Journal Name: Review of Scientific Instruments
- Country of Publication:
- United States
- Language:
- English
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