The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities

Cao, Yue; Sheyfer, Dina; Jiang, Zhang; Maddali, Siddharth; You, Hoydoo; Wang, Bi-Xia; Ye, Zuo-Guang; Dufresne, Eric M.; Zhou, Hua; Stephenson, G. Brian; Hruszkewycz, Stephan O.

doi:10.3390/cryst10121109

Title: The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities

Journal Article · Fri Dec 04 00:00:00 EST 2020 · Crystals

DOI:https://doi.org/10.3390/cryst10121109· OSTI ID:1734888

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Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division; Simon Fraser Univ., Burnaby, BC (Canada)
Simon Fraser Univ., Burnaby, BC (Canada)

How materials evolve at thermal equilibrium and under external excitations at small length and time scales is crucial to the understanding and control of material properties. X-ray photon correlation spectroscopy (XPCS) at X-ray free electron laser (XFEL) facilities can in principle capture dynamics of materials that are substantially faster than a millisecond. However, the analysis and interpretation of XPCS data is hindered by the strongly fluctuating X-ray intensity from XFELs. Here we examine the impact of pulse-to-pulse intensity fluctuations on sequential XPCS analysis. We show that the conventional XPCS analysis can still faithfully capture the characteristic time scales, but with substantial decrease in the signal-to-noise ratio of the g₂ function and increase in the uncertainties of the extracted time constants. We also demonstrate protocols for improving the signal-to-noise ratio and reducing the uncertainties.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; Natural Sciences and Engineering Research Council of Canada (NSERC)

Grant/Contract Number:: AC02-06CH11357; RGPIN-2017-06915

OSTI ID:: 1734888

Journal Information:: Crystals, Vol. 10, Issue 12; ISSN 2073-4352

Publisher:: MDPICopyright Statement

Country of Publication:: United States

Language:: English

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Title: The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities

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