Strain dependence of Auger recombination in 3 μm GaInAsSb/GaSb type-I active regions
- Univ. of Colorado, Boulder, CO (United States)
- Univ. of Texas, Austin, TX (United States)
- National Inst. of Standards and Technology (NIST), Boulder, CO (United States)
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States). Center for Integrated Nanotechnologies (CINT)
We differentiate the effect of strain induced by lattice-mismatched growth from strain induced by mechanical deformation on cubic nonradiative Auger recombination in narrow-gap GaInAsSb/GaSb quantum well (QW) heterostructures. The typical reduction in the Auger coefficient observed with lattice-mismatched growth appears to be due to the concomitant compositional change rather than the addition of strain, with implications for mid-IR semiconductor laser design. We induced a range of internal compressive strain in five samples from -0.90% to -2.07% by varying the composition during the growth and mechanically induced a similar range of internal strain in analogous quantum well membrane samples. We performed time-resolved photoluminescence and differential reflectivity measurements to extract the carrier recombination dynamics, taken at 300 K with carrier densities from cm-3 to cm-3. We observed no change with strain in the cubic Auger coefficient of samples that were strained mechanically, but we did observe a trend with strain in samples that were strained by the QW alloy composition. Measured Auger coefficients ranged from cm6 s-1 to cm6 s-1.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC). Basic Energy Sciences (BES); National Science Foundation (NSF); Center for Integrated Nanotechnologies (CINT); Defense Advanced Research Projects Agency (DARPA); US Air Force Office of Scientific Research (AFOSR)
- Grant/Contract Number:
- 89233218CNA000001
- OSTI ID:
- 1726199
- Report Number(s):
- LA-UR--20-23245
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 26 Vol. 116; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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