Towards data-driven next-generation transmission electron microscopy

Spurgeon, Steven R.; Ophus, Colin; Jones, Lewys; Petford-Long, Amanda; Kalinin, Sergei V.; Olszta, Matthew J.; Dunin-Borkowski, Rafal E.; Salmon, Norman; Hattar, Khalid; Yang, Wei-Chang D.; Sharma, Renu; Du, Yingge; Chiaramonti, Ann; Zheng, Haimei; Buck, Edgar C.; Kovarik, Libor; Penn, R. Lee; Li, Dongsheng; Zhang, Xin; Murayama, Mitsuhiro; Taheri, Mitra L.

doi:10.1038/s41563-020-00833-z

Towards data-driven next-generation transmission electron microscopy

Journal Article · Mon Oct 26 00:00:00 EDT 2020 · Nature Materials

DOI:https://doi.org/10.1038/s41563-020-00833-z· OSTI ID:1721601

^[1]; ^[2]; ^[3]; Petford-Long, Amanda ^[4]; ^[5]; ^[1]; ^[6]; Salmon, Norman ^[7]; Hattar, Khalid ^[8]; ^[9]; ^[9]; ^[1]; ^[10]; ^[11]; ^[1]; Kovarik, Libor ^[1]; Penn, R. Lee ^[12]; ^[1]; ^[1]; ^[13] more »

Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy
Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin (Ireland); Trinity College Dublin (Ireland)
Argonne National Lab. (ANL), Argonne, IL (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Forschungszentrum Juelich (Germany)
Hummingbird Scientific, Lacey, WA (United States)
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies
National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
National Inst. of Standards and Technology (NIST), Boulder, CO (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Univ. of Minnesota, Minneapolis, MN (United States)
Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
Johns Hopkins Univ., Baltimore, MD (United States)

Electron microscopy touches on nearly every aspect of modern life, underpinning materials development for quantum computing, energy and medicine. We discuss the open, highly integrated and data-driven microscopy architecture needed to realize transformative discoveries in the coming decade.

View Accepted Manuscript (DOE)

Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States); Pacific Northwest National Laboratory (PNNL), Richland, WA (United States); Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: European Research Council (ERC); National Science Foundation (NSF); Science Foundation Ireland (SFI); USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE Office of Science (SC), Biological and Environmental Research (BER)

Grant/Contract Number:: AC02-05CH11231; AC02-06CH11357; AC04-94AL85000; AC05-76RL01830; NA0003525

OSTI ID:: 1721601

Alternate ID(s):: OSTI ID: 1773092
OSTI ID: 1774802

Report Number(s):: PNNL-SA--152427; SAND--2020-9902J; 690708

Journal Information:: Nature Materials, Journal Name: Nature Materials Journal Issue: 3 Vol. 20; ISSN 1476-1122

Publisher:: Springer Nature - Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

References (27)

In Situ Environmental Cell–Transmission Electron Microscopy Study of Microbial Reduction of Chromium(VI) Using Electron Energy Loss Spectroscopy Daulton, Tyrone L.; Little, Brenda J.; Lowe, Kristine Microscopy and Microanalysis, Vol. 7, Issue 6 https://doi.org/10.1007/S10005-001-0021-3	journal	November 2001
The 2017 Nobel Prize in Chemistry: cryo-EM comes of age Shen, Peter S. Analytical and Bioanalytical Chemistry, Vol. 410, Issue 8 https://doi.org/10.1007/s00216-018-0899-8	journal	February 2018
Environmental high resolution electron microscopy and applications to chemical science Boyes, E. D.; Gai, P. L. Ultramicroscopy, Vol. 67, Issue 1-4 https://doi.org/10.1016/S0304-3991(96)00099-X	journal	June 1997
Informatics and data science in materials microscopy Voyles, Paul M. Current Opinion in Solid State and Materials Science, Vol. 21, Issue 3 https://doi.org/10.1016/j.cossms.2016.10.001	journal	June 2017
Big data in cryoEM: automated collection, processing and accessibility of EM data Baldwin, Philip R.; Tan, Yong Zi; Eng, Edward T. Current Opinion in Microbiology, Vol. 43 https://doi.org/10.1016/j.mib.2017.10.005	journal	June 2018
K2: A Super-Resolution Electron Counting Direct Detection Camera for Cryo-EM Booth, C. Microscopy and Microanalysis, Vol. 18, Issue S2 https://doi.org/10.1017/S1431927612002243	journal	July 2012
Approaching the “Lab in the Gap”: First Results from a Versatile In-situ (S)TEM Borrnert, Felix; Muller, Heiko; Linck, Martin Microscopy and Microanalysis, Vol. 21, Issue S3 https://doi.org/10.1017/S1431927615001294	journal	August 2015
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol Microscopy and Microanalysis, Vol. 22, Issue 1 https://doi.org/10.1017/S1431927615015664	journal	January 2016
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond Ophus, Colin Microscopy and Microanalysis, Vol. 25, Issue 3 https://doi.org/10.1017/S1431927619000497	journal	May 2019
USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data Somnath, Suhas; Smith, Chris R.; Laanait, Nouamane Microscopy and Microanalysis, Vol. 25, Issue S2 https://doi.org/10.1017/S1431927619001831	journal	August 2019
Atomic-Scale Observations of Catalyst Structures under Reaction Conditions and during Catalysis Tao, Franklin (Feng); Crozier, Peter A. Chemical Reviews, Vol. 116, Issue 6 https://doi.org/10.1021/cr5002657	journal	March 2016
Electric-field sensing using single diamond spins Dolde, F.; Fedder, H.; Doherty, M. W. Nature Physics, Vol. 7, Issue 6 https://doi.org/10.1038/nphys1969	journal	April 2011
Atomic resolution electron microscopy in a magnetic field free environment Shibata, N.; Kohno, Y.; Nakamura, A. Nature Communications, Vol. 10, Issue 1 https://doi.org/10.1038/s41467-019-10281-2	journal	May 2019
Electron ptychography of 2D materials to deep sub-ångström resolution Jiang, Yi; Chen, Zhen; Han, Yimo Nature, Vol. 559, Issue 7714 https://doi.org/10.1038/s41586-018-0298-5	journal	July 2018
Machine learning for molecular and materials science Butler, Keith T.; Davies, Daniel W.; Cartwright, Hugh Nature, Vol. 559, Issue 7715 https://doi.org/10.1038/s41586-018-0337-2	journal	July 2018
Observing crystal nucleation in four dimensions using atomic electron tomography Zhou, Jihan; Yang, Yongsoo; Yang, Yao Nature, Vol. 570, Issue 7762 https://doi.org/10.1038/s41586-019-1317-x	journal	June 2019
Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity Hart, James L.; Lang, Andrew C.; Leff, Asher C. Scientific Reports, Vol. 7, Issue 1 https://doi.org/10.1038/s41598-017-07709-4	journal	August 2017
The FAIR Guiding Principles for scientific data management and stewardship Wilkinson, Mark D.; Dumontier, Michel; Aalbersberg, IJsbrand Jan Scientific Data, Vol. 3, Issue 1 https://doi.org/10.1038/sdata.2016.18	journal	March 2016
The Sloan Digital Sky Survey: Technical Summary York, Donald G.; Adelman, J.; Anderson, Jr., John E. The Astronomical Journal, Vol. 120, Issue 3 https://doi.org/10.1086/301513	journal	September 2000
Metallic Phase with Long-Range Orientational Order and No Translational Symmetry Shechtman, D.; Blech, I.; Gratias, D. Physical Review Letters, Vol. 53, Issue 20, p. 1951-1953 https://doi.org/10.1103/PhysRevLett.53.1951	journal	November 1984
The development of the electron microscope and of electron microscopy Ruska, Ernst Reviews of Modern Physics, Vol. 59, Issue 3 https://doi.org/10.1103/RevModPhys.59.627	journal	July 1987
Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microscopy study Ziatdinov, Maxim; Dyck, Ondrej; Li, Xin Science Advances, Vol. 5, Issue 9 https://doi.org/10.1126/sciadv.aaw8989	journal	September 2019
Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope Varela, M.; Lupini, A. R.; Benthem, K. van Annual Review of Materials Research, Vol. 35, Issue 1 https://doi.org/10.1146/annurev.matsci.35.102103.090513	journal	August 2005
A fast image simulation algorithm for scanning transmission electron microscopy Ophus, Colin Advanced Structural and Chemical Imaging, Vol. 3, Issue 1 https://doi.org/10.1186/s40679-017-0046-1	journal	May 2017
Towards an integrated materials characterization toolbox Robertson, Ian M.; Schuh, Christopher A.; Vetrano, John S. Journal of Materials Research, Vol. 26, Issue 11 https://doi.org/10.1557/jmr.2011.41	journal	June 2011
Cryogenic electron microscopy for quantum science Minor, Andrew M.; Denes, Peter; Muller, David A. MRS Bulletin, Vol. 44, Issue 12 https://doi.org/10.1557/mrs.2019.288	journal	December 2019
Crystallography and Databases Bruno, Ian; Gražulis, Saulius; Helliwell, John R. Data Science Journal, Vol. 16 https://doi.org/10.5334/dsj-2017-038	journal	August 2017

Similar Records

Basic Research Needs for Catalysis Science to Transform Energy Technologies: Report from the U.S. Department of Energy, Office of Basic Energy Sciences Workshop May 8–10, 2017, in Gaithersburg, Maryland

Technical Report · Mon May 08 00:00:00 EDT 2017 · OSTI ID:1616260

Related Subjects

36 MATERIALS SCIENCE
biochemistry
chemistry
materials science
medical research
nanoscience and technology

Towards data-driven next-generation transmission electron microscopy

Citation Formats

References (27)

Similar Records

Related Subjects