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U.S. Department of Energy
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Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments Physical Mechanisms and Foundations for Hardness Assurance.

Conference ·

Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1706313
Report Number(s):
SAND2008-6851P; 508961
Country of Publication:
United States
Language:
English

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