Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Diagnostic Fabrication: A look into front and back end-of-the-line fabrication of diagnostic devices to evaluate APAM process.

Conference ·
OSTI ID:1700539

Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1700539
Report Number(s):
SAND2019-13289D; 680975
Country of Publication:
United States
Language:
English

Similar Records

Back End Processing and CV Characterization for Qubit Devices.
Conference · Wed Jul 01 00:00:00 EDT 2009 · OSTI ID:1278740

Front End Compatible Through Silicon Via Fabrication.
Conference · Mon Oct 01 00:00:00 EDT 2012 · OSTI ID:1116323

Thermomechanical Modeling of Back-End-of-the-Line 3D Interconnects.
Conference · Fri May 01 00:00:00 EDT 2009 · OSTI ID:1141972

Related Subjects