Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Displacement Damage and Ionization Effects in TaOx and TiO2 Memristors.

Conference ·
OSTI ID:1682565

Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1682565
Report Number(s):
SAND2013-10822P; 493205
Country of Publication:
United States
Language:
English

Similar Records

The Effects of Ionizing Radiation on TaOx-based Memristors.
Conference · Sat Jan 31 23:00:00 EST 2015 · OSTI ID:1238219

The Effects of Ionizing Radiation on TaOx-based Memristors.
Conference · Wed Jul 01 00:00:00 EDT 2015 · OSTI ID:1266837

A Comparison of the Radiation Response of TaOx and TiO2 Memristors.
Conference · Mon Jul 01 00:00:00 EDT 2013 · OSTI ID:1106767

Related Subjects