Statistical Profiles of E1 EMP Coupling to Single Conductors

Technical Report · Thu Oct 01 04:00:00 EDT 2020

DOI:https://doi.org/10.2172/1678836· OSTI ID:1678836

Schiek, Richard ^[1]; Halligan, Matthew ^[1]

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1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

An electro-magnetic pulse (EMP) event can induce large currents and voltages on electrical conductors such as electrical power transmission lines which span many kilometers and the shorter lines typically tens of meters in length used to monitor equipment controlling the power grid. The exact current and voltage induced on a conductor depends on many factors, such as line height, diameter and length as well as ground conductivity and the location of the EMP event relative to the conductor. The current work focus on the line location and orientation relative to the EMP source. A statistical, Monte-Carlo approach is used in sampling the line configuration and then calculating the induced current and voltage. Thousands of EMP events are simulated on the region of the Earth where the EMP event can couple to a given above-ground conductor and the resulting current and voltage is then calculated on that conductor. Through the many simulations, one can assemble statistics on the insult including the peak value, rise time and pulse width.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program
• DOE Contract Number: AC04-94AL85000; NA0003525
• OSTI ID: 1678836
• Report Number(s): SAND--2020-10738; 691517
• Country of Publication: United States
• Language: English

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