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Title: Distribution of Deep Level Defects in InGaN/GaN LEDs and their Dependence on In Alloying.

Conference ·
OSTI ID:1671589

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1671589
Report Number(s):
SAND2013-7490P; 471135
Resource Relation:
Conference: Proposed for presentation at the International Conference on Nitride Semiconductors 2013 held August 25-30, 2013 in Washington, DC.
Country of Publication:
United States
Language:
English