Recovering cavity effects in corrugated organic light emitting diodes

Fu, Xiangyu; Chen, Yi-An; Shin, Dong-Hun; Mehta, Yash; Chen, I-Te; Barange, Nilesh; Zhu, Liping; Amoah, Stephen; Chang, Chih-Hao; So, Franky

doi:10.1364/OE.404412

Title: Recovering cavity effects in corrugated organic light emitting diodes

Journal Article · Fri Oct 09 00:00:00 EDT 2020 · Optics Express

DOI:https://doi.org/10.1364/OE.404412· OSTI ID:1671363

Fu, Xiangyu;

; Shin, Dong-Hun; Mehta, Yash; Chen, I-Te; Barange, Nilesh; Zhu, Liping; Amoah, Stephen; Chang, Chih-Hao; So, Franky

Cavity effects play an important role in determining the out-coupling efficiency of an OLED. By fabricating OLEDs on corrugated substrates, the waveguide and SPP modes can be extracted by diffraction. However, corrugation does not always lead to an enhancement in out-coupling efficiency due to the reduction of the electrode reflectance and hence the cavity effects. Based on the results of our rigorous couple-wave analysis (RCWA) simulation, we found that the cavity effects can be partially recovered using a low index Teflon layer inserted between the ITO anode and the substrate due to the enhancement of the reflectance of the corrugated electrodes. To verify the simulation results, we fabricated corrugated OLEDs having a low-index Teflon interlayer with an EQE of 36%, which is 29% higher than an optimized planar OLED. By experimentally measuring the OLED air mode dispersion, we confirm the cavity emission of a corrugated OLED is enhanced by the low index layer.

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Research Organization:: North Carolina State Univ., Raleigh, NC (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE)

Grant/Contract Number:: FOA-0001823; EE0007624

OSTI ID:: 1671363

Alternate ID(s):: OSTI ID: 1848540

Journal Information:: Optics Express, Journal Name: Optics Express Vol. 28 Journal Issue: 21; ISSN 1094-4087

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

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