Analysis of structure-property gradients in orthogonally machined chips and workpiece subsurface

Fernandez-Zelaia, Patxi; Melkote, Shreyes N.

doi:10.1016/j.cirp.2020.04.020

Analysis of structure-property gradients in orthogonally machined chips and workpiece subsurface

Journal Article · Sun May 17 00:00:00 EDT 2020 · CIRP Annals

DOI:https://doi.org/10.1016/j.cirp.2020.04.020· OSTI ID:1657968

Fernandez-Zelaia, Patxi ^[1]; ^[2]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Georgia Inst. of Technology, Atlanta, GA (United States)
Georgia Inst. of Technology, Atlanta, GA (United States)

Production of machined surfaces with optimized mechanical properties requires fundamental process-structure-property knowledge. In this paper, we focus on structure-property gradients in orthogonally cut OFHC Copper chips and the workpiece subsurface. We utilize orientation imaging microscopy and statistical spatial correlation metrics to quantify the microstructure. Constitutive elastic-plastic properties of the workpiece subsurface and chips are measured using spherical nanoindentation. Analysis of the data reveals significant structure and property gradients in both regions. Differences and similarities in structure and property gradients near the workpiece surface and tool-chip interface, and in the chip middle are discussed and explained.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1657968

Journal Information:: CIRP Annals, Journal Name: CIRP Annals Journal Issue: 1 Vol. 69; ISSN 0007-8506

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

References (15)

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