Aluminum oxide free-standing thin films to enable nitrogen edge soft x-ray scattering

Ye, Dan; Rongpipi, Sintu; Litofsky, Joshua H.; Lee, Youngmin; Culp, Tyler E.; Yoo, Sang Ha; Jackson, Thomas N.; Wang, Cheng; Gomez, Esther W.; Gomez, Enrique D.

doi:10.1557/mrc.2018.195

Title: Aluminum oxide free-standing thin films to enable nitrogen edge soft x-ray scattering

Journal Article · Mon Sep 17 00:00:00 EDT 2018 · MRS Communications

DOI:https://doi.org/10.1557/mrc.2018.195· OSTI ID:1656502

Ye, Dan ^[1]; Rongpipi, Sintu ^[1]; Litofsky, Joshua H. ^[1]; Lee, Youngmin ^[1]; Culp, Tyler E. ^[1]; Yoo, Sang Ha ^[1]; Jackson, Thomas N. ^[1]; Wang, Cheng ^[2]; Gomez, Esther W. ^[3]; Gomez, Enrique D. ^[3]

Pennsylvania State Univ., University Park, PA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
Pennsylvania State Univ., University Park, PA (United States); Pennsylvania State Univ., University Park, PA (United States). Materials Research Inst.

Resonant soft x-ray scattering (RSoXS) leverages chemical specificity to characterize thin films but is limited near the nitrogen edge. The challenge is that commercially available x-ray transparent substrates are composed of Si₃N₄ and thereby absorb incident x-rays and generate incoherent fluorescence. To overcome this challenge, we designed and fabricated Al₂O₃ free-standing films for use as RSoXS windows. Al2O3 films offer higher x-ray transmittance and minimal fluorescence near the nitrogen edge. As an example, Al₂O₃ windows allow for nitrogen RSoXS of conjugated block copolymer thin films that reveal domain spacings, which are not apparent with commercially available Si₃N₄ substrates.

View Accepted Manuscript (DOE)

Cite

Export

Save

Research Organization:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)

Grant/Contract Number:: AC02-05CH11231; MRI-1626566

OSTI ID:: 1656502

Journal Information:: MRS Communications, Vol. 9, Issue 01; ISSN 2159-6859

Publisher:: Materials Research Society - Cambridge University PressCopyright Statement

Country of Publication:: United States

Language:: English

Citation Metrics:

Cited by: 5 works

Citation information provided by
Web of Science

References (21)

Photovoltaic Performance of Block Copolymer Devices Is Independent of the Crystalline Texture in the Active Layer Guo, Changhe; Lee, Youngmin; Lin, Yen-Hao Macromolecules, Vol. 49, Issue 12 https://doi.org/10.1021/acs.macromol.6b00370	journal	June 2016
Signatures of Multiphase Formation in the Active Layer of Organic Solar Cells from Resonant Soft X-ray Scattering Guo, Changhe; Kozub, Derek R.; Vajjala Kesava, Sameer ACS Macro Letters, Vol. 2, Issue 3 https://doi.org/10.1021/mz300547x	journal	February 2013
Signatures of Intracrystallite and Intercrystallite Limitations of Charge Transport in Polythiophenes Vakhshouri, Kiarash; Smith, Brandon H.; Chan, Edwin P. Macromolecules, Vol. 49, Issue 19 https://doi.org/10.1021/acs.macromol.6b01086	journal	September 2016
Fracture toughness of silicon nitride thin films of different thicknesses as measured by bulge tests Merle, B.; Göken, M. Acta Materialia, Vol. 59, Issue 4 https://doi.org/10.1016/j.actamat.2010.11.043	journal	February 2011
Resonant soft X-ray scattering for polymer materials Liu, Feng; Brady, Michael A.; Wang, Cheng European Polymer Journal, Vol. 81 https://doi.org/10.1016/j.eurpolymj.2016.04.014	journal	August 2016
Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films Collins, B. A.; Cochran, J. E.; Yan, H. Nature Materials, Vol. 11, Issue 6 https://doi.org/10.1038/nmat3310	journal	April 2012
The mechanical properties of atomic layer deposited alumina for use in micro- and nano-electromechanical systems Tripp, Marie K.; Stampfer, Christoph; Miller, David C. Sensors and Actuators A: Physical, Vol. 130-131 https://doi.org/10.1016/j.sna.2006.01.029	journal	August 2006
Analysis of Order Formation in Block Copolymer Thin Films Using Resonant Soft X-ray Scattering Virgili, Justin M.; Tao, Yuefei; Kortright, Jeffrey B. Macromolecules, Vol. 40, Issue 6 https://doi.org/10.1021/ma061734k	journal	March 2007
Resonant soft X-ray scattering reveals cellulose microfibril spacing in plant primary cell walls Ye, Dan; Kiemle, Sarah N.; Rongpipi, Sintu Scientific Reports, Vol. 8, Issue 1 https://doi.org/10.1038/s41598-018-31024-1	journal	August 2018
Role of Solution Structure in Self-Assembly of Conjugated Block Copolymer Thin Films Brady, Michael A.; Ku, Sung-Yu; Perez, Louis A. Macromolecules, Vol. 49, Issue 21 https://doi.org/10.1021/acs.macromol.6b01686	journal	October 2016
The influence of molecular orientation on organic bulk heterojunction solar cells Tumbleston, John R.; Collins, Brian A.; Yang, Liqiang Nature Photonics, Vol. 8, Issue 5 https://doi.org/10.1038/nphoton.2014.55	journal	April 2014
Solving the mystery of the internal structure of casein micelles Ingham, B.; Erlangga, G. D.; Smialowska, A. Soft Matter, Vol. 11, Issue 14 https://doi.org/10.1039/C5SM00153F	journal	January 2015
Molecular Rectification in Conjugated Block Copolymer Photovoltaics Grieco, Christopher; Aplan, Melissa P.; Rimshaw, Adam The Journal of Physical Chemistry C, Vol. 120, Issue 13 https://doi.org/10.1021/acs.jpcc.6b00103	journal	March 2016
Oxygen K Edge Scattering from Bulk Comb Diblock Copolymer Reveals Extended, Ordered Backbones above Lamellar Order–Disorder Transition Kortright, Jeffrey B.; Sun, Jing; Spencer, Ryan K. The Journal of Physical Chemistry B, Vol. 121, Issue 1 https://doi.org/10.1021/acs.jpcb.6b09925	journal	December 2016
Tuning the synthesis of fully conjugated block copolymers to minimize architectural heterogeneity Lee, Youngmin; Aplan, Melissa P.; Seibers, Zach D. Journal of Materials Chemistry A, Vol. 5, Issue 38 https://doi.org/10.1039/C7TA06758E	journal	January 2017
Conjugated Block Copolymer Photovoltaics with near 3% Efficiency through Microphase Separation Guo, Changhe; Lin, Yen-Hao; Witman, Matthew D. Nano Letters, Vol. 13, Issue 6 https://doi.org/10.1021/nl401420s	journal	May 2013
Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis Gann, E.; Young, A. T.; Collins, B. A. Review of Scientific Instruments, Vol. 83, Issue 4 https://doi.org/10.1063/1.3701831	journal	April 2012
Revisiting the interpretation of casein micelle SAXS data Ingham, B.; Smialowska, A.; Erlangga, G. D. Soft Matter, Vol. 12, Issue 33 https://doi.org/10.1039/C6SM01091A	journal	January 2016
Nanomorphology of Bulk Heterojunction Photovoltaic Thin Films Probed with Resonant Soft X-ray Scattering Swaraj, Sufal; Wang, Cheng; Yan, Hongping Nano Letters, Vol. 10, Issue 8 https://doi.org/10.1021/nl1009266	journal	August 2010
Absolute Measurement of Domain Composition and Nanoscale Size Distribution Explains Performance in PTB7:PC ₇₁ BM Solar Cells Collins, Brian A.; Li, Zhe; Tumbleston, John R. Advanced Energy Materials, Vol. 3, Issue 1 https://doi.org/10.1002/aenm.201200377	journal	October 2012
Young’s modulus of silicon nitride used in scanning force microscope cantilevers Khan, A.; Philip, J.; Hess, P. Journal of Applied Physics, Vol. 95, Issue 4 https://doi.org/10.1063/1.1638886	journal	February 2004

Similar Records

New Homogeneous Standards by Atomic Layer Deposition for Synchrotron X-ray Fluorescence and Absorption Spectroscopies.

Conference · Tue Mar 13 00:00:00 EDT 2012 · OSTI ID:1656502

Butterworth, A L; Becker, N; Gainsforth, Z; +8 more

Optical characteristics of nanocrystalline Al{sub x}Ga{sub 1−x}N thin films deposited by hollow cathode plasma-assisted atomic layer deposition

Journal Article · Thu May 15 00:00:00 EDT 2014 · Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films · OSTI ID:1656502

Goldenberg, Eda; Ozgit-Akgun, Cagla; Biyikli, Necmi; +1 more

Resonant Soft X-Ray Scattering Provides Protein Structure with Chemical Specificity

Journal Article · Thu Nov 01 00:00:00 EDT 2018 · Structure · OSTI ID:1656502

Ye, Dan; Le, Thinh P.; Kuei, Brooke; +5 more

Related Subjects

36 MATERIALS SCIENCE

Title: Aluminum oxide free-standing thin films to enable nitrogen edge soft x-ray scattering

Citation Formats

References (21)

Similar Records

Related Subjects