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A soft x-ray spectrometer for resonant inverse photoemission

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1146441· OSTI ID:165346
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  1. Institut de Physique, Universite de Neuchatel, CH2000 Neuchatel (Switzerland)
We describe the concept and the performances of a new tunable soft x-ray inverse photoemission (IPES) spectrometer. The instrument is based on a variable-geometry Bragg spectrograph, and it can be operated with minor modifications over a wide range of photon energies (600{lt}{ital h}{nu}{lt}4000 eV). It was originally designed for IPES measurements of cerium compounds at the Ce {ital M}{sub 5}(3{ital d}{sub 5/2}{r_arrow}4{ital f},{ital h}{nu}=883 eV) absorption edge, where the Ce 4{ital f} IPES cross section is resonantly enhanced. Such resonant IPES (RIPES) spectra, now routinely performed by this instrument, are 10--100 times more sensitive to the Ce 4{ital f} states than conventional x-ray bremsstrahlung spectra, with a comparable energy resolution ({Delta}{ital E}{similar_to}600 meV). We plan to exploit the wide tunability of the spectrometer to perform RIPES measurements of other correlated materials, namely at the Cu {ital L}{sub 2,3}(2{ital p}{r_arrow}{ital d},{ital h}{nu}=930 and 950 eV) edge in the high-{ital T}{sub {ital c}} superconductors. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.
OSTI ID:
165346
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 7 Vol. 66; ISSN 0034-6748; ISSN RSINAK
Country of Publication:
United States
Language:
English