Scanning tunneling microscopy current--voltage characteristics of carbon nanotubes

Journal Article · Tue Feb 28 23:00:00 EST 1995 · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena

DOI:https://doi.org/10.1116/1.588374· OSTI ID:165131

Rivera, W; Perez, J M ^[1]; Ruoff, R S; Lorents, D C; Malhotra, R ^[2]; Lim, S; Rho, Y G; Jacobs, E G; Pinizzotto, R F ^[1]

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1. Department of Physics, University of North Texas, Denton, Texas 76203 (United States)
2. SRI International, Inc., Menlo Park, California 94025 (United States)

Scanning tunneling microscopy (STM) has been used to obtain images and current--voltage ({ital I}--{ital V}) curves of carbon nanotubes produced by arc discharge of carbon electrodes. The STM {ital I}--{ital V} curves indicate that carbon nanotubes with diameters from 2.0 to 5.1 nm have a metallic density of states. Using STM, we also observe nanometer-size graphene sheets which are four graphite layers thick. The STM images of carbon nanotubes are in good agreement with transmission electron microscope images. {copyright} {ital 1995} {ital American} {ital Vacuum} {ital Society}

• OSTI ID: 165131
• Journal Information: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 2 Vol. 13; ISSN 0734-211X; ISSN JVTBD9
• Country of Publication: United States
• Language: English

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