Secondary-ion-mass-spectroscopy study of oxygen tracer diffusion in a {ital c}-axis-oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film
Journal Article
·
· Physical Review, B: Condensed Matter
- Department of Materials, Imperial College of Science Technology Medicine, London SW7 2BP (United Kingdom)
- Department of Electronic and Electrical Engineering and Center for High Temperature Superconductivity, Imperial College of Science Technology Medicine, London SW7 2BT (United Kingdom)
- National Physical Laboratory, Teddington, Middlesex, TW11 0LW (United Kingdom)
The atomic motion of oxygen in a {ital c}-axis-oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film was studied with implanted {sup 18}O as a tracer. Conventional annealing in an oxygen flowing ambient was performed for 1 hour at various temperatures between 175 and 550 {degree}C. Analysis by secondary-ion mass spectroscopy shows that the implanted {sup 18}O starts to migrate within the YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film at a low temperature, between 250 and 300 {degree}C. Results from gas/solid oxygen isotopic exchange shows that at 315 {degree}C oxygen can enter the YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film and confirms the high mobility of oxygen within the film even at this low temperature. The apparent volume diffusivity of the oxygen at 315 {degree}C is found to be {similar_to}1.5{times}10{sup {minus}13} cm{sup 2}/s. Short-circuit diffusion is thought to play an important role in determining the high mobility of oxygen in the {ital c}-axis-oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film.
- OSTI ID:
- 165115
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 13 Vol. 51; ISSN 0163-1829; ISSN PRBMDO
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
BARIUM OXIDES
CUPRATES
DIFFUSION
EPITAXY
HIGH-TC SUPERCONDUCTORS
ION IMPLANTATION
ION MICROPROBE ANALYSIS
MASS SPECTROSCOPY
OXYGEN 18
SUPERCONDUCTING FILMS
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
YTTRIUM OXIDES
BARIUM OXIDES
CUPRATES
DIFFUSION
EPITAXY
HIGH-TC SUPERCONDUCTORS
ION IMPLANTATION
ION MICROPROBE ANALYSIS
MASS SPECTROSCOPY
OXYGEN 18
SUPERCONDUCTING FILMS
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
YTTRIUM OXIDES