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Secondary-ion-mass-spectroscopy study of oxygen tracer diffusion in a {ital c}-axis-oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film

Journal Article · · Physical Review, B: Condensed Matter
;  [1]; ;  [2]; ; ;  [1];  [3]
  1. Department of Materials, Imperial College of Science Technology Medicine, London SW7 2BP (United Kingdom)
  2. Department of Electronic and Electrical Engineering and Center for High Temperature Superconductivity, Imperial College of Science Technology Medicine, London SW7 2BT (United Kingdom)
  3. National Physical Laboratory, Teddington, Middlesex, TW11 0LW (United Kingdom)
The atomic motion of oxygen in a {ital c}-axis-oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film was studied with implanted {sup 18}O as a tracer. Conventional annealing in an oxygen flowing ambient was performed for 1 hour at various temperatures between 175 and 550 {degree}C. Analysis by secondary-ion mass spectroscopy shows that the implanted {sup 18}O starts to migrate within the YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film at a low temperature, between 250 and 300 {degree}C. Results from gas/solid oxygen isotopic exchange shows that at 315 {degree}C oxygen can enter the YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film and confirms the high mobility of oxygen within the film even at this low temperature. The apparent volume diffusivity of the oxygen at 315 {degree}C is found to be {similar_to}1.5{times}10{sup {minus}13} cm{sup 2}/s. Short-circuit diffusion is thought to play an important role in determining the high mobility of oxygen in the {ital c}-axis-oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} film.
OSTI ID:
165115
Journal Information:
Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 13 Vol. 51; ISSN 0163-1829; ISSN PRBMDO
Country of Publication:
United States
Language:
English