Method of authenticating integrated circuits using optical characteristics of physically unclonable functions
A method and apparatus for reading unique identifiers of an integrated circuit. The unique identifiers may be physically unclonable functions (PUFs), formed by high energy ions implanted into semiconductor material of the integrated circuit. The method may include electrically or optically stimulating each of the PUFs and sensing with an optical sensor optical characteristics of resulting light emitted from the PUFs. Then the method may include comparing values associated with the optical characteristics of the PUFs with groups of stored values in a circuit database. Each of the groups of stored values may be associated with optical characteristics of PUFs of a known authentic circuit. The method may then include the controller providing verification of authenticity of the integrated circuit when each of the values associated with the optical characteristics of the PUFs match the stored values of at least one of the groups in the circuit database.
- Research Organization:
- Kansas City Plant (KCP), Kansas City, MO (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- NA0002839
- Assignee:
- Honeywell Federal Manufacturing & Technologies, LLC (Kansas City, MO)
- Patent Number(s):
- 10,691,787
- Application Number:
- 15/936,605
- OSTI ID:
- 1651059
- Resource Relation:
- Patent File Date: 03/27/2018
- Country of Publication:
- United States
- Language:
- English
Reliable Physical Unclonable Function for Device Authentication
|
patent-application | February 2014 |
Intrinsic Physical Layer Authentication of Integrated Circuits
|
patent-application | May 2013 |
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