NLTL Frequency Chirp through Dynamic Bias of Inductor Cores.

Conference · Mon Jul 01 04:00:00 EDT 2019

DOI:https://doi.org/10.1109/PPPS34859.2019.9009789· OSTI ID:1641143

Schrock, Emily Ann; Borchardt, John Joseph; Coleman, Phillip D.; Miller, Seth

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1641143
• Report Number(s): SAND2019-7919C; 677297
• Country of Publication: United States
• Language: English