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U.S. Department of Energy
Office of Scientific and Technical Information

Pattern Induced Bias in Digital Image Correlation.

Conference ·
OSTI ID:1640639
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000;
OSTI ID:
1640639
Report Number(s):
SAND2019-6187C; 676043
Conference Information:
Proposed for presentation at the Society of Experimental Mechanics held June 3 - May 10, 2019 in Reno, Nevada.
Country of Publication:
United States
Language:
English

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