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Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics

Journal Article · · Beilstein Journal of Nanotechnology
DOI:https://doi.org/10.3762/bjnano.9.171· OSTI ID:1628621
 [1];  [2];  [2]
  1. Univ. of Connecticut, Storrs, CT (United States). Dept. of Materials Science and Engineering; DOE/OSTI
  2. Univ. of Connecticut, Storrs, CT (United States). Dept. of Materials Science and Engineering
The nanoscale optoelectronic properties of materials can be especially important for polycrystalline photovoltaics including many sensor and solar cell designs. For thin film solar cells such as CdTe, the open-circuit voltage and short-circuit current are especially critical performance indicators, often varying between and even within individual grains. A new method for directly mapping the open-circuit voltage leverages photo-conducting AFM, along with an additional proportional-integral-derivative feedback loop configured to maintain open-circuit conditions while scanning. Alternating with short-circuit current mapping efficiently provides complementary insight into the highly microstructurally sensitive local and ensemble photovoltaic performance. Furthermore, direct open-circuit voltage mapping is compatible with tomographic AFM, which additionally leverages gradual nanoscale milling by the AFM probe essentially for serial sectioning. The two-dimensional and three-dimensional results for CdTe solar cells during in situ illumination reveal local to mesoscale contributions to PV performance based on the order of magnitude variations in photovoltaic properties with distinct grains, at grain boundaries, and for sub-granular planar defects.
Research Organization:
Univ. of Connecticut, Storrs, CT (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
Grant/Contract Number:
FG02-00ER41132
OSTI ID:
1628621
Journal Information:
Beilstein Journal of Nanotechnology, Journal Name: Beilstein Journal of Nanotechnology Vol. 9; ISSN 2190-4286
Publisher:
Beilstein InstituteCopyright Statement
Country of Publication:
United States
Language:
English

References (30)

Understanding the Beneficial Role of Grain Boundaries in Polycrystalline Solar Cells from Single-Grain-Boundary Scanning Probe Microscopy journal March 2006
How Polycrystalline Devices Can Outperform Single-Crystal Ones: Thin Film CdTe/CdS Solar Cells journal June 2004
Direct Imaging of Cl- and Cu-Induced Short-Circuit Efficiency Changes in CdTe Solar Cells journal May 2014
Mapping photovoltaic performance with nanoscale resolution journal October 2015
Indentation mapping revealed poroelastic, but not viscoelastic, properties spanning native zonal articular cartilage journal December 2017
The thermo-mechanical degradation of ethylene vinyl acetate used as a solar panel adhesive and encapsulant journal July 2016
Non-destructive determination of phase, size, and strain of individual grains in polycrystalline photovoltaic materials journal December 2021
High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes journal November 2008
Nanometer-scale electronic and microstructural properties of grain boundaries in Cu(In,Ga)Se2 journal August 2011
Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices journal April 2014
Nanoscale Imaging of Photocurrent and Efficiency in CdTe Solar Cells journal October 2014
Real-space observation of unbalanced charge distribution inside a perovskite-sensitized solar cell journal September 2014
Charge transport in CdTe solar cells revealed by conductive tomographic atomic force microscopy journal September 2016
Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers journal November 1999
Recombination by grain-boundary type in CdTe journal July 2015
Error-corrected AFM: a simple and broadly applicable approach for substantially improving AFM image accuracy journal March 2014
Ion-damage-free planarization or shallow angle sectioning of solar cells for mapping grain orientation and nanoscale photovoltaic properties journal April 2017
Key Aspects of CdTe/CdS Solar Cells journal January 2002
Investigating the Role of Grain Boundaries in CZTS and CZTSSe Thin Film Solar Cells with Scanning Probe Microscopy journal January 2012
Characterization of ethylene vinyl acetate (EVA) encapsulant: Effects of thermal processing and weathering degradation on its discoloration journal January 1992
TEM, AFM, and cathodoluminescence characterization of CdTe thin films journal May 2001
Characterisation of thin film CdS/CdTe solar cells using electron and optical beam induced current journal February 1999
Mapping the Photoresponse of CH 3 NH 3 PbI 3 Hybrid Perovskite Thin Films at the Nanoscale journal May 2016
Efficient silicon light-emitting diodes journal August 2001
Trapped charge-driven degradation of perovskite solar cells journal November 2016
Physics and chemistry of CdTe/CdS thin film heterojunction photovoltaic devices: fundamental and critical aspects journal January 2014
Enhanced electrical properties at boundaries including twin boundaries of polycrystalline CdTe thin-film solar cells journal January 2015
Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects journal July 2012
Solar radiation durability of materials components and systems for Low Concentration Photovoltaic Systems conference May 2011
Investigation of Acetic Acid Corrosion Impact on Printed Solar Cell Contacts journal May 2015

Cited By (2)

Investigation of AFM-based machining of ferroelectric thin films at the nanoscale journal January 2020
Scanning probe microscopy for energy-related materials journal January 2019

Figures / Tables (4)


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