Challenges and complexities of multifrequency atomic force microscopy in liquid environments

Solares, Santiago D.

doi:10.3762/bjnano.5.33

Challenges and complexities of multifrequency atomic force microscopy in liquid environments

Journal Article · Tue Dec 31 23:00:00 EST 2013 · Beilstein Journal of Nanotechnology

DOI:https://doi.org/10.3762/bjnano.5.33· OSTI ID:1628614

Solares, Santiago D. ^[1]

Univ. of Maryland, College Park, MD (United States). Dept. of Mechanical Engineering; DOE/OSTI

This paper illustrates through numerical simulation the complexities encountered in high-damping AFM imaging, as in liquid enviroments, within the specific context of multifrequency atomic force microscopy (AFM). The focus is primarily on (i) the amplitude and phase relaxation of driven higher eigenmodes between successive tip–sample impacts, (ii) the momentary excitation of non-driven higher eigenmodes and (iii) base excitation artifacts. The results and discussion are mostly applicable to the cases where higher eigenmodes are driven in open loop and frequency modulation within bimodal schemes, but some concepts are also applicable to other types of multifrequency operations and to single-eigenmode amplitude and frequency modulation methods.

View Accepted Manuscript (DOE)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division

OSTI ID:: 1628614

Journal Information:: Beilstein Journal of Nanotechnology, Journal Name: Beilstein Journal of Nanotechnology Vol. 5; ISSN BJNEAH; ISSN 2190-4286

Publisher:: Beilstein InstituteCopyright Statement

Country of Publication:: United States

Language:: English

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