Characterization of nanoscale temperature fields during electromigration of nanowires

Jeong, Wonho; Kim, Kyeongtae; Kim, Youngsang; Lee, Woochul; Reddy, Pramod

doi:10.1038/srep04975

Title: Characterization of nanoscale temperature fields during electromigration of nanowires

Journal Article · Thu May 15 00:00:00 EDT 2014 · Scientific Reports

DOI:https://doi.org/10.1038/srep04975· OSTI ID:1624713

Jeong, Wonho ^[1]; Kim, Kyeongtae ^[1]; Kim, Youngsang ^[1]; Lee, Woochul ^[1]; Reddy, Pramod ^[2]

Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Mechanical Engineering
Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Mechanical Engineering; Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Materials Science and Engineering

Quantitative studies of nanoscale heat dissipation (Joule heating) are essential for advancing nano-science and technology. Joule heating is widely expected to play a critical role in accelerating electromigration induced device failure. However, limitations in quantitatively probing temperature fields—with nanoscale resolution—have hindered elucidation of the role of Joule heating in electromigration. In this work, we use ultra-high vacuum scanning thermal microscopy to directly quantify thermal fields in nanowires during electromigration. Our results unambiguously illustrate that electromigration begins at temperatures significantly lower than the melting temperature of gold. Further, we show that during electromigration voids predominantly accumulate at the cathode resulting in both local hot spots and asymmetric temperature distributions. These results provide novel insights into the microscopic details of hot spot evolution during electromigration and are expected to guide the design of reliable nanoscale functional devices.

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Research Organization:: Univ. of Michigan, Ann Arbor, MI (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: SC0004871

OSTI ID:: 1624713

Journal Information:: Scientific Reports, Vol. 4, Issue 1; ISSN 2045-2322

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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