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Title: Single-defect spectroscopy in the shortwave infrared

Abstract

Chemical defects that fluoresce in the shortwave infrared open exciting opportunities in deep-penetration bioimaging, chemically specific sensing, and quantum technologies. However, the atomic size of defects and the high noise of infrared detectors have posed significant challenges to the studies of these unique emitters. Here we demonstrate high throughput single-defect spectroscopy in the shortwave infrared capable of quantitatively and spectrally resolving chemical defects at the single defect level. By cooling an InGaAs detector array down to -190 °C and implementing a nondestructive readout scheme, we are able to capture low light fluorescent events in the shortwave infrared with a signal-to-noise ratio improved by more than three orders-of-magnitude. As a demonstration, we show it is possible to resolve individual chemical defects in carbon nanotube semiconductors, simultaneously collecting a full spectrum for each defect within the entire field of view at the single defect limit.

Authors:
ORCiD logo; ORCiD logo; ORCiD logo; ORCiD logo
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). The Center for Enhanced Nanofluidic Transport (CENT); Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF); National Institutes of Health (NIH)/National Institute of General Medical Sciences (NIGMS)
OSTI Identifier:
1619526
Alternate Identifier(s):
OSTI ID: 1613113
Grant/Contract Number:  
SC0019112; CHE-150797; CHE-1904488; R01GM114167
Resource Type:
Journal Article: Published Article
Journal Name:
Nature Communications
Additional Journal Information:
Journal Name: Nature Communications Journal Volume: 10 Journal Issue: 1; Journal ID: ISSN 2041-1723
Publisher:
Nature Publishing Group
Country of Publication:
United Kingdom
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Wu, Xiaojian, Kim, Mijin, Qu, Haoran, and Wang, YuHuang. Single-defect spectroscopy in the shortwave infrared. United Kingdom: N. p., 2019. Web. doi:10.1038/s41467-019-10788-8.
Wu, Xiaojian, Kim, Mijin, Qu, Haoran, & Wang, YuHuang. Single-defect spectroscopy in the shortwave infrared. United Kingdom. https://doi.org/10.1038/s41467-019-10788-8
Wu, Xiaojian, Kim, Mijin, Qu, Haoran, and Wang, YuHuang. Mon . "Single-defect spectroscopy in the shortwave infrared". United Kingdom. https://doi.org/10.1038/s41467-019-10788-8.
@article{osti_1619526,
title = {Single-defect spectroscopy in the shortwave infrared},
author = {Wu, Xiaojian and Kim, Mijin and Qu, Haoran and Wang, YuHuang},
abstractNote = {Chemical defects that fluoresce in the shortwave infrared open exciting opportunities in deep-penetration bioimaging, chemically specific sensing, and quantum technologies. However, the atomic size of defects and the high noise of infrared detectors have posed significant challenges to the studies of these unique emitters. Here we demonstrate high throughput single-defect spectroscopy in the shortwave infrared capable of quantitatively and spectrally resolving chemical defects at the single defect level. By cooling an InGaAs detector array down to -190 °C and implementing a nondestructive readout scheme, we are able to capture low light fluorescent events in the shortwave infrared with a signal-to-noise ratio improved by more than three orders-of-magnitude. As a demonstration, we show it is possible to resolve individual chemical defects in carbon nanotube semiconductors, simultaneously collecting a full spectrum for each defect within the entire field of view at the single defect limit.},
doi = {10.1038/s41467-019-10788-8},
url = {https://www.osti.gov/biblio/1619526}, journal = {Nature Communications},
issn = {2041-1723},
number = 1,
volume = 10,
place = {United Kingdom},
year = {2019},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at https://doi.org/10.1038/s41467-019-10788-8

Citation Metrics:
Cited by: 6 works
Citation information provided by
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