Scanning tunneling shot-noise spectroscopy in Kondo systems

Cocklin, Sagen; Morr, Dirk K.

doi:10.1103/PhysRevB.100.125146

Scanning tunneling shot-noise spectroscopy in Kondo systems

Journal Article · Fri Sep 20 00:00:00 EDT 2019 · Physical Review. B

DOI:https://doi.org/10.1103/PhysRevB.100.125146· OSTI ID:1618191

Cocklin, Sagen ^[1]; ^[1]

Univ. of Illinois, Chicago, IL (United States)

Using a large-

N

theory in combination with the Keldysh nonequilibrium Green's function formalism, we investigate the current, differential conductance, zero-frequency shot noise, and Fano factor as measured by scanning tunneling shot-noise spectroscopy (STSNS) using a scanning tunneling microscope (STM) near single Kondo impurities and in Kondo lattices. We show that the Fano factor

F

exhibits a characteristic bias dependence arising from Kondo screening that is similar to the Kondo resonance observed in the differential conductance. Moreover, the line shape of

F

is strongly dependent on the ratio of the tunneling amplitudes for electron tunneling from the STM tip into the conduction band and electronic levels of the magnetic adatoms. We demonstrate that the Fano factor can be enhanced or suppressed due to interference effects and as such, is not only a sensitive probe for the correlation effects arising from Kondo screening, but also for quantum interference between tunneling electrons. We identify a correlation between the form of the differential conductance and the Fano factor that could be tested in future STSNS experiments.

View Accepted Manuscript (DOE)

Research Organization:: Univ. of Illinois at Urbana-Champaign, IL (United States); Univ. of Illinois, Chicago, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: FG02-05ER46225

OSTI ID:: 1618191

Alternate ID(s):: OSTI ID: 1609690
OSTI ID: 1563012
OSTI ID: 2897299

Journal Information:: Physical Review. B, Journal Name: Physical Review. B Journal Issue: 12 Vol. 100; ISSN 2469-9950; ISSN PRBMDO

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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