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Title: Grid-assisted magnetron sputtering deposition of nitrogen graded TiN thin films

Journal Article · · SN Applied Sciences
ORCiD logo [1];  [2]; ORCiD logo [3];  [4];  [5];  [5];  [6]
  1. Escola Politecnica da Univ. de Sao Paulo (Brazil); Centro Estadual de Educação Tecnológica Paula Souza (CEETEPS), Cotia (Brazil)
  2. Montanuniversitaet Leoben (Austria)
  3. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division
  4. Comissao Nacional de Energia Nuclear, Sao Paulo (Brazil)
  5. Univ. do Estado de Santa Catarina, Joinville (Brazil)
  6. Escola Politecnica da Univ. de Sao Paulo (Brazil)

Titanium Nitride (TiN) films were obtained using the grid-assisted magnetron sputtering deposition technique on Al substrates in two conditions: under constant and variable nitrogen concentration along the thin solid film thickness. The formation of a film with variable N concentration (herein referred as graded film) was confirmed using energy filtered transmission electron microscopy, X-ray photoelectron spectroscopy and grazing incidence X-ray diffraction. The TiN thin films microstructures were also analysed using scanning and transmission electron microscopies (SEM and TEM). Finally, the viability of synthesizing TiN thin films with variable N concentration is herein proposed as an alternative method for tailoring the properties of such functional coating materials.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE; Brazilian National Research, Technology and Innovation Council (CNPq); Sao Paulo State Research Funding Foundation (FAPESP); Santa Catarina State Research Funding Agency (FAPESC)
Grant/Contract Number:
AC05-00OR22725; AC05-06OR23100; 312424/2013-2; 2016/05768-2; PAP-TR-655
OSTI ID:
1616822
Journal Information:
SN Applied Sciences, Vol. 2, Issue 5; ISSN 2523-3963
Publisher:
Springer NatureCopyright Statement
Country of Publication:
United States
Language:
English

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