Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction

Dunlap, Bret E.; Ruggles, Timothy J.; Fullwood, David T.; Jackson, Brian; Crimp, Martin A.

doi:10.1016/j.ultramic.2017.08.017

Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction

Journal Article · Fri Sep 01 00:00:00 EDT 2017 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2017.08.017· OSTI ID:1614703

Dunlap, Bret E. ^[1]; Ruggles, Timothy J. ^[2]; Fullwood, David T. ^[3]; Jackson, Brian ^[3]; Crimp, Martin A. ^[4]

Michigan State Univ., East Lansing, MI (United States); michigan state university
National Inst. of Aerospace, Hampton, VA (United States)
Brigham Young Univ., Provo, UT (United States)
Michigan State Univ., East Lansing, MI (United States)

In this paper, the relative capabilities and limitations of electron channeling contrast imaging (ECCI) and cross-correlation electron backscattered diffraction (CC-EBSD) have been assessed by studying the dislocation distributions resulting from nanoindentation in body centered cubic Ta. Qualitative comparison reveals very similar dislocation distributions between the CC-EBSD mapped GNDs and the ECC imaged dislocations. Approximate dislocation densities determined from ECC images compare well to those determined by CC-EBSD. Nevertheless, close examination reveals subtle differences in the details of the distributions mapped by these two approaches. Finally, the details of the dislocation Burgers vectors and line directions determined by ECCI have been compared to those determined using CC-EBSD and reveal good agreement.

View Accepted Manuscript (DOE)

Research Organization:: Michigan State Univ., East Lansing, MI (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division

Grant/Contract Number:: SC0001525; SC0012587

OSTI ID:: 1614703

Journal Information:: Ultramicroscopy, Journal Name: Ultramicroscopy Journal Issue: PA Vol. 184; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation Nakafuji, Keiichiro; Koyama, Motomichi; Tsuzaki, Kaneaki Scientific Reports, Vol. 10, Issue 1 https://doi.org/10.1038/s41598-020-59429-x	journal	February 2020

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Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction

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