Modern Scattering-Type Scanning Near-Field Optical Microscopy for Advanced Material Research

Chen, Xinzhong; Hu, Debo; Mescall, Ryan; You, Guanjun; Basov, D. N.; Dai, Qing; Liu, Mengkun

doi:10.1002/adma.201804774

Title: Modern Scattering-Type Scanning Near-Field Optical Microscopy for Advanced Material Research

Journal Article · Mon Apr 01 00:00:00 EDT 2019 · Advanced Materials

DOI:https://doi.org/10.1002/adma.201804774· OSTI ID:1611781

^[1]; Hu, Debo ^[2]; Mescall, Ryan ^[1]; You, Guanjun ^[3]; Basov, D. N. ^[4]; Dai, Qing ^[2]; Liu, Mengkun ^[1]

Department of Physics and AstronomyStony Brook University Stony Brook NY 11794 USA
Division of NanophotonicsCAS Center for Excellence in NanoscienceNational Center for Nanoscience and Technology Beijing 100190 China
Shanghai Key Lab of Modern Optical Systems and Engineering Research Center of Optical Instrument and SystemMinistry of EducationUniversity of Shanghai for Science and Technology Shanghai 200093 China
Department of PhysicsColumbia University New York NY 10027 USA

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Research Organization:: Pennsylvania State Univ., University Park, PA (United States); Columbia Univ., New York, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0012375; SC0018218; SC0018426; SC0019443

OSTI ID:: 1611781

Journal Information:: Advanced Materials, Vol. 31, Issue 24; ISSN 0935-9648

Publisher:: Wiley

Country of Publication:: United States

Language:: English

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