Design of ePixM, a fully-depleted monolithic CMOS active pixel sensor for soft X-ray experiments at LCLS-II

Rota, L.; Tamma, C.; Segal, J. D.; Caragiulo, P.; Kenney, C.; Dragone, A.

doi:10.1088/1748-0221/14/12/c12014

Title: Design of ePixM, a fully-depleted monolithic CMOS active pixel sensor for soft X-ray experiments at LCLS-II

Journal Article · Fri Dec 13 00:00:00 EST 2019 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/14/12/c12014· OSTI ID:1604571

Rota, L. ^[1]; Tamma, C. ^[1]; Segal, J. D. ^[1]; Caragiulo, P. ^[1]; Kenney, C. ^[1]; Dragone, A. ^[1]

SLAC National Accelerator Lab., Menlo Park, CA (United States)

The LCLS-II Free Electron Laser (FEL) will produce X-ray pulses with a repetition rate of up to 1 MHz and energies between 250 eV and 5 keV. Experiments conducted at LCLS-II will require 2D imaging detectors with a unique set of features, such as high-spatial resolution, low-noise performance, high-dynamic range and high-frame rates up to 1 MHz. We present the design of ePixM, a fully-depleted monolithic CMOS detector tailored for soft X-rays applications at high-repetition rates FEL. It consists of an array of 384×192 active pixel sensors, with a pixel size of 50×50 μm² and a total sensitive area of 2×1 cm². ePixM has been designed in a 150 nm CMOS technology on high-resistivity substrate to achieve full depletion of the substrate. Each pixel includes a Charge Sensitive Amplifier (CSA) with gain auto-ranging capability and a noise-shaper performing Correlated Double Sampling (CDS). A novel technique named correlated pre-charging removes the excess noise introduced by the gain-switching mechanism. The performance of the design has been evaluated through post-layout simulations. The Equivalent Noise Charge (ENC) of 11.3 electrons enables single-photon detection at X-ray energies down to 250 eV, and the dynamic range exceeds 10³ photons at 500 eV thanks to the auto-ranging circuitry.

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Research Organization:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1604571

Journal Information:: Journal of Instrumentation, Vol. 14, Issue 12; ISSN 1748-0221

Publisher:: Institute of Physics (IOP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 1 work

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