Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

Nishiyama, Toshiyuki; Bostedt, Christoph; Ferguson, Ken R.; Hutchison, Christopher; Nagaya, Kiyonobu; Fukuzawa, Hironobu; Motomura, Koji; Wada, Shin-ichi; Sakai, Tsukasa; Matsunami, Kenji; Matsuda, Kazuhiro; Tachibana, Tetsuya; Ito, Yuta; Xu, Weiqing; Mondal, Subhendu; Umemoto, Takayuki; Miron, Catalin; Nicolas, Christophe; Kameshima, Takashi; Joti, Yasumasa; Tono, Kensuke; Hatsui, Takaki; Yabashi, Makina; Ueda, Kiyoshi

doi:10.3390/app9224932

Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

Journal Article · Sat Nov 16 00:00:00 EST 2019 · Applied Sciences

DOI:https://doi.org/10.3390/app9224932· OSTI ID:1598410

Nishiyama, Toshiyuki ^[1]; Bostedt, Christoph ^[2]; Ferguson, Ken R. ^[3]; Hutchison, Christopher ^[4]; Nagaya, Kiyonobu ^[1]; ^[5]; Motomura, Koji ^[6]; ^[7]; Sakai, Tsukasa ^[4]; Matsunami, Kenji ^[4]; Matsuda, Kazuhiro ^[4]; Tachibana, Tetsuya ^[6]; Ito, Yuta ^[6]; Xu, Weiqing ^[6]; Mondal, Subhendu ^[6]; Umemoto, Takayuki ^[7]; ^[8]; Nicolas, Christophe ^[9]; Kameshima, Takashi ^[10]; Joti, Yasumasa ^[10] more »

Kyoto Univ. (Japan); RIKEN SPring-8 Center (Japan)
SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS); Argonne National Lab. (ANL), Lemont, IL (United States); Paul-Scherrer Inst. (Switzerland); Ecole Polytechnique Federale Lausanne (Switzerland)
SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS)
Kyoto Univ. (Japan)
RIKEN SPring-8 Center (Japan); Tohoku Univ., Sendai (Japan)
Tohoku Univ., Sendai (Japan)
Hiroshima Univ. (Japan)
Synchrotron SOLEIL, Gif-sur-Yvette (France); National Inst. for Physics and Nuclear Engineering (Romania); Univ. Paris-Saclay, Gif-sur-Yvette (France)
Synchrotron SOLEIL, Gif-sur-Yvette (France)
Japan Synchrotron Radiation Research Inst. (JASRI), Hyogo (Japan)
RIKEN SPring-8 Center (Japan)

X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work, we demonstrate how single-shot small-angle X-ray scattering (SAXS) measurements combined with fluorescence and ion time-of-flight (TOF) spectroscopy can be used to obtain size- and structure-selective evaluation of the light-matter interaction processes on the nanoscale. We recorded the SAXS images of single xenon clusters using XFEL pulses provided by the SPring-8 Angstrom compact free-electron laser (SACLA). The XFEL fluences and the radii of the clusters at the reaction point were evaluated and the ion TOF spectra and fluorescence spectra were sorted accordingly. We found that the XFEL fluence and cluster size extracted from the diffraction patterns showed a clear correlation with the fluorescence and ion TOF spectra. Our results demonstrate the effectiveness of the multispectroscopic approach for exploring laser–matter interaction in the X-ray regime without the influence of the size distribution of samples and the fluence distribution of the incident XFEL pulses.

View Accepted Manuscript (DOE)

Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: Japan Society for the Promotion of Science (JSPS); Ministry of Education, Culture, Sports, Science and Technology (MEXT); National Natural Science Foundation of China (NSFC); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Chemical Sciences, Geosciences & Biosciences Division; USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences & Biosciences Division

Grant/Contract Number:: AC02-06CH11357; AC02-76SF00515

OSTI ID:: 1598410

Alternate ID(s):: OSTI ID: 1761523

Journal Information:: Applied Sciences, Journal Name: Applied Sciences Journal Issue: 22 Vol. 9; ISSN ASPCC7; ISSN 2076-3417

Publisher:: MDPICopyright Statement

Country of Publication:: United States

Language:: English

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