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Title: Measurement of PuO2 film thickness by electron probe microanalysis (EPMA) calibration curve method

Journal Article · · Journal of Nuclear Materials

Plutonium (Pu) surfaces are highly reactive toward oxygen containing species and, therefore, invariably covered with oxides (e.g. PuO2) during transport and handling. The actual thickness of the surface oxide may dictate if a plutonium part is suitable for a certain application. As a result, a cost-effective, quick, non-destructive, yet reliable means to measure the oxide layer thickness formed on Pu samples is desirable. In this study, the cross-sections of a series of room temperature grown oxides on Pu samples were trenched by focus ion beam (FIB) then observed by scanning electron microscopy (SEM) to measure the surface oxide thicknesses, which were then combined with the corresponding oxygen k-ratios provided by electron probe microanalysis (EPMA) to form calibration curves. Oxide thickness measurements for the calibration curves were made on samples within the typical SEM observable range for PuO2 (35–400 nm). The portion of the calibration curve in the thinner oxide region (<35 nm) were approximated via Pouchou and Pichoir’s Φ(ρz) theory. Two specimens with micrometer-thick PuO2 standards (one formed at room temperature and the other at higher temperature with a higher level of crystallinity) were made for the k-ratios in this study, allowing EPMA users to choose the standard that best suits their needs. If the surface corrosion is known to be PuO2 (from the environment in which the Pu sample is stored) or if the stoichiometry of the surface oxide is confirmed by a preliminary/compliment technique, these calibration curves allow EPMA users to quickly and efficiently determine PuO2 thicknesses from the measured oxygen k-ratios of their samples. The methodology presented in this study can also be used as a template for creating calibration curves for oxides grown on other actinides.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1597211
Alternate ID(s):
OSTI ID: 1581010
Report Number(s):
LLNL-JRNL-791483; 990598; TRN: US2103785
Journal Information:
Journal of Nuclear Materials, Vol. 530, Issue C; ISSN 0022-3115
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 9 works
Citation information provided by
Web of Science

References (7)

Oxidation kinetics of plutonium in air: consequences for environmental dispersal journal June 1998
Measuring the Thickness of Native Plutonium Oxides Using EPMA journal August 2005
Comparison of the sputter rates of oxide films relative to the sputter rate of SiO2
  • Baer, D. R.; Engelhard, M. H.; Lea, A. S.
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 28, Issue 5 https://doi.org/10.1116/1.3456123
journal September 2010
Electron Probe Microanalysis Through Coated Oxidized Surfaces journal July 2019
Electron probe microanalysis (EPMA) measurement of aluminum oxide film thickness in the nanometer range on aluminum sheets journal January 2005
Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system journal May 2019
Application of linear least squares to the analysis of Auger electron spectroscopy depth profiles of plutonium oxides
  • Donald, Scott B.; Stanford, Jeff A.; McLean, William
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 36, Issue 3 https://doi.org/10.1116/1.5021587
journal May 2018

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